Beamline description

Scientific applications

Study of interfaces and surfaces at air or under ultra high vacuum, and micro & nano -structure or objects by X-ray scattering techniques during ex situ in situ or operando experiments.

Three instruments:

INS²: In Situ Nanostructures and Surfaces (UHV)

GMT: Multipurpose goniometer

µLaue: Laue Microdiffraction setup

General overview of the beamline activities

Status: open

Disciplines

Physics
Materials and Engineering
Chemistry
Environmental Sciences
Cultural Heritage

Applications

Strain/structure on nano-objects on surface
Structure of buried (encapsulated) interface
Energy
Metallurgy
Applied materials
Mechanics at micrometre scale
Fundamental growth mechanisms

Techniques

GID - grazing incidence diffraction
GISAXS - grazing incidence small-angle scattering
XRR - X-ray reflectivity
DAFS - diffraction anomalous fine structure
XRD - X-ray diffraction
Laue diffraction

Energy range

5.0 - 30.0 keV

Beam size

Minimum (H x V) : 300.0 x 300.0 nm²
Maximum (H x V) : 500.0 x 300.0 µm²

Sample environments

UHV preparation chamber (<10-10 mbar)
Furnace (up to 1400 C)
Cryo_Furnace (from -180 C - 500 C)
Sample charger for XRR and Laue microdiffraction

Detectors

2D detector: EIGER 1M Si , MaxiPix Si and CdTe, EIGER 4M CdTe
SDD fluorescence detector (Ketek)

Technical details

3 instruments for surface and interface X-ray scattering ex situ, in situ or oprando experiments. Hard X-rays allow to probe buried interfaces or microstructure in depth.