dedicated to
The Centre National de la Recherche Scientifique (CNRS) and the Commissariat à l'Energie Atomique et aux énergies alternatives (CEA) have jointly constructed and now operate the CRG-IF beamline at ESRF in order to propose powerful X-ray beams to french surface researchers. One third of the beamtime is allocated in counterpart to the european scientific community. This beamline opened at the beginning of the ESRF, was the first CRG Beamline operational. BM32 is now composed of technical and scientific staff coming from CNRS (UMR SyMMES CNRS-CEA/IRIG and Institut Néel), and CEA (DRF/IRIG/MEM).
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CRG-IF beamlime is member of the 5 french beamlines located at the ESRF forming the F-CRG facility.
Last 5 years CRG-IF BM32 beamline science and capabilites are described in the report to the BeamLine Review Panel.
Two instruments are available to offer a complementary characterization of surfaces and interfaces in soft and hard condensed matter:
A new instrument (since march 2006) designed for submicronic focussed white beam (Laue) diffraction:
Beamtime can be allocated by submitting proposals to two scientific program committees:
When choosing the suited instrument for your experiments during the electronic submission procedure please:
2ND proposal calls with new upgraded ESRF Extremely-Brilliant-Source
for the period from end of March 2022 to end july 2022. Beamtime is reserved to french laboratories, academic groups or teams with at least one french researcher, post-doc or phD student.
for the period from march 2022 to end july 2022. Beamtime is reserved to laboratories or academic groups of european ESRF contributors countries including France.
see more details in BM32 User guide
In case of troubleshoutings, issues with instruments & software, get prepared with your future experiments environment: BM32 WIKI
Beamline activites and capabilities are described in the pages of this website. Scientific production is listed in Beamline & Publications and with corresponding impact metrics:
The Google scholar profile contains all digital documents found in the web where 'BM32 beamline' appears explicitely in the core text.
Optics Hutch has been completely refurbished since January 2006. It has allowed to improve the X-ray Beam features coming in the two experimental hutches (flux, spot size on sample and energy resolution...) and namely to achieve a sub micrometric beamsize via a pinhole and two focussing mirrors.
By using large area and fast detector, Data Analysis has become one of the highest priorities of the beamline development in providing a full efficient measurements chain to users to investigate structural properties of materials. LaueTools software suite can be downloaded from gitlab.esrf.fr. It allows to handle, visualize, reduce and interpret data recorded by Laue Microdiffraction Probe.
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| Featured Experiments | Optics | |||
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| Practical User guide | Location | |||
AlHassan A., Abboud A., Cornelius T.W., Ren Z., Thomas O., Richter G., Micha J.S., Send S., Hartmann R., Strüder L., Pietsch U.,
Journal of Applied Crystallography 54, 80-86 (2021)
Biquard X., Ballet P., Tuaz A., Jouneau P.H., Rieutord F.,
Journal of Synchrotron Radiation 28, 181-187 (2021)
Boubon R., Nelayah J., Tardif S., Deschanels X., Rébiscoul D.,
Materials 14, 2017-1-2017-16 (2021)
Carnis J., Kshirsagar A.R., Wu L., Dupraz M., Labat S., Texier M., Favre L., Gao L., Oropeza F.E., Gazit N., Almog E., Campos A., Micha J.S., Hensen E.J.M., Leake S.J., Schülli T.U., Rabkin E., Thomas O., Poloni R., Hofmann J.P., Richard M.I.,
Nature Communications 12, 5385-1-5385-10 (2021)
De Santis M., Langlais V., Schneider K., Torrelles X.,
Journal of Physics Condensed Matter 33, 265002-1-265002-7 (2021)
Elder K.L.M., Andrews W.B., Ziehmer M., Mameka N., Kirchlechner C., Davydok A., Micha J.S., Chadwick A.F., Lilleodden E.T., Thornton K., Voorhees P.W.,
Proceedings of the National Academy of Sciences of the USA 118, e2104132118-1-e2104132118-10 (2021)
Lauraux F., Labat S., Yehya S., Richard M.I., Leake S.J., Zhou T., Micha J.S., Robach O., Kovalenko O., Rabkin E., Schülli T.U., Thomas O., Cornelius T.W.,
Crystals 11, 312-1-132-10 (2021)
Lauraux F., Yehya S., Labat S., Micha J.S., Robach O., Kovalenko O., Rabkin E., Thomas O., Cornelius T.W.,
Nano Select 2, 99-106 (2021)
Ors T., Gouraud F., Michel V., Huger M., Gey N., Micha J.S., Castelnau O., Guinebretière R.,
Materials Science and Engineering A 806, 140817-1-140817-10 (2021)
Barbier C., Zhou T., Renaud G., Geaymond O., Le Fèvre P., Glas F., Madouri A., Cavanna A., Travers L., Morassi M., Gogneau N., Tchernycheva M., Harmand J.C., Largeau L.,
Crystal Growth & Design 20, 4013-4019 (2020)
Dai Z., Alyabyeva N., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Lazzari R.,
Applied Surface Science 509, 145312-1-145312-7 (2020)
Dai Z., Alyabyeva N., Van den Bossche M., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Noguera C., Goniakowski J., Lazzari R.,
Physical Review Materials 4, 074409-1-074409-11 (2020)
Michaud L.G., Castán C., Zussy M., Montméat P., Mareau V.H., Gonon L., Fournel F., Rieutord F., Tardif S.,
Nanotechnology 31, 145302-1-145302-7 (2020)
Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O.,
Applied Physics Letters 116, 243101-1-243101-5 (2020)
Sant R., Gay M., Marty A., Lisi S., Harrabi R., Vergnaud C., Dau M.T., Weng X., Coraux J., Gauthier N., Renault O., Renaud G., Jamet M.,
Npj 2D Materials and Applications 4, 41-1-41-8 (2020)
Sant R., Lisi S., Nguyen V.D., Mazaleyrat E., Gómez Herrero A.C., Geaymond O., Guisset V., David P., Marty A., Jamet M., Chapelier C., Magaud L., Dappe Y.J., Bianchi M., Hofmann P., Renaud G., Coraux J.,
Journal of Physical Chemistry C 124, 12397-12408 (2020)
Capiod P., Bardotti L., Tamion A., Boisron O., Albin C., Dupuis V., Renaud G., Ohresser P., Tournus F.,
Physical Review Letters 122, 106802-1-106802 -7 (2019)
De Santis M., Bailly A., Coates I., Grenier S., Heckmann O., Hricovini K., Joly Y., Langlais V., Ramos A.Y., Richter C., Torrelles X., Garaudée S., Geaymond O., Ulrich O.,
Acta Crystallographica B 75, 8-17 (2019)
Fragkos S., Sant R., Alvarez C., Bosak A., Tsipas P., Tsoutsou D., Okuno H., Renaud G., Dimoulas A.,
Advanced Materials Interfaces 6, 1801850-1-1801850-9 (2019)
Fragkos S., Sant R., Alvarez C., Golias E., Marquez-Velasco J., Tsipas P., Tsoutsou D., Aminalragia-Giamini S., Xenogiannopoulou E., Okuno H., Renaud G., Rader O., Dimoulas A.,
Physical Review Materials 3, 104201-1-104201-8 (2019)
partners
European Synchrotron Radiation Facility - 71, avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.