[LT] [LAUE] Data Analysis with LaueTools

(4) In-situ Laue micro-diffraction during compression tests on Ce-TZP single crystal micropillars

[C] [LAUE] [6.2] Magalhaes M.D., Douillard T., Reveron H., Comby-Dassonneville S., Cornelius T.W., Meille S., Texier M.,Micha J.S., Rodney D., Thomas O., Chevalier J., Journal of the European Ceramic Society 45, 116794-1-116794-9 (2025) https://doi.org/10.1016/j.jeurceramsoc.2024.116794

Toward the Identification of Point Defects Formation and Solution Growth Mechanisms ofHerbertsmithite ZnxCu4–x(OH)6Cl2 Crystals

[C] [LAUE] [3.4] Paul Raj V.S., Pena-Revellez A., Micha J.S., Purushottam Raj Purohit R.R.P., Chaussende D., Verdier M.,Motto-Ros V., Bert F., Mendels P., Montes-Hernandez G., Velazquez M., Crystal Growth & Design 25, 2857-2873 (2025) https://doi.org/10.1021/acs.cgd.4c01483

(2) Eutectic grains and orientation relationships in thin directionally solidified Al-Al2Cu samples: A Laue micro-diffraction study,

[C] [LAUE] [6.3] Medjkoune M., Bottin-Rousseau S., Carroz L., Soucek R., Prévot G., Croset B., Micha J.-S., Akamatsu S., J. Alloys and Compounds 1036, 181841 ttps://doi.org/10.1016/j.jallcom.2025.181841

Three-point bending behavior of individual ZnO nanowires studied by in situ Laue microdiffraction

[U] [LAUE] [2.8] Saïdi S., Texier M., Sharma S., Ardila G. Ternon C., Micha J.-S., Escoubas S., Thomas O., Cornelius T.W., Journal of Applied Crystallography 58, 1149-1158 (2025) https://doi.org/10.1107/S1600576725003668

(1) Intermitted 3D diffraction tomography combined with in situ Laue diffraction to characterize dislocation structures and stress fields in microbending cantilevers

 

[C] [LAUE] [3.3] Molin J.B., Renversade L., Micha J.S., Ulrich O., Robach O., Gruber P.A., Kirchlechner C., Advanced Engineering Materials 26, 2400357-1-2400357-12 (2024) https://doi.org/10.1002/adem.202400357

(3) Electrical activation of insulator-to-metal transition in vanadium dioxide single-crystal nanobeam and their high-frequency switching performances

[C] [LAUE] [2.5] Orlianges J.C., Allegret O., Sirjita E.N., Masson A., Boulle A., Théry V., Tardif S., Micha J.S., Crunteanu A., Journal of Applied Physics 136, 064502 -1-064502 -7 (2024) https://doi.org/10.1063/5.0221152

(3) Laue microdiffraction on polycrystalline samples above 1500 K thanks to the QMAX-microLaue furnace

[IHR] [LAUE] [2.8] Purohit R.R.P.P.R., Fowan D., Arnaud S., Blanc N., Micha J.S., Guinebretière R., Castelnau O., Journal of Applied Crystallography 57, 470-480 (2024) https://doi.org/10.1063/5.0221152

(2) Energy-dispersive Laue diffraction analysis of the influence of statherin and histatin on the crystallographic texture during human dental enamel demineralization

[C] [LAUE] [2.8] Sakr C., Al-Mosawi M., Grünewald T.A., Cook P., Tack P., Vincze L., Micha J.S., Anderson P., Al-Jawad M., Lichtenegger H.C., Journal of Applied Crystallography 57, 1514-1527 (2024) https://doi.org/10.1107/S1600576724007180

 

(6) CNN-based laue spot morphology predictor for reliable crystallographic descriptor estimation

[IHR] [LAUE] [3.2] Kirstein T., Petrich L., Purohit R.R.P.P.R., Micha J.S., Schmidt V., Materials 16, 3397-1-3397-16 (2023) https://doi.org/10.3390/ma16093397

(17) “In-situ characterization of thermomechanical behavior of copper nano-interconnect for 3D integration”,

[U] [LAUE] [3.1] Ayoub B., Moreau S., Lhostis S., Frémont H., Mermoz S., Souchier E., Deloffre E., Escoubas S., Cornelius T.W., Thomas O., Microelectronic Engineering 261, 111809-1-111809-6 (2022) https://doi.org/10.1016/j.mee.2022.111809

“Using 2D integral breadth to study plastic relaxation in a quasi-lattice-matched HgCdTe/CdZnTe heterostructure”,

[U] [LAUE] [2.8] Biquard X., Tuaz A., Ballet P., Journal of Applied Crystallography 55, 1297-1304 (2022) https://doi.org/10.1107/S1600576722008184

(25) “LaueNN: Neural-network-based hkl recognition of Laue spots and its application to polycrystalline materials”,

[IHR] [LAUE] [2.8] Purushottam Raj Purohit R.R.P., Tardif S., Castelnau O., Eymery J., Guinebretière R., Robach O., Ors T., Micha J.S., Journal of Applied Crystallography 55, 737-750 (2022) https://doi.org/10.1107/S1600576722004198

(51) “Grain structure engineering of NiTi shape memory alloys by intensive plastic deformation”

 

[C] [LAUE] [8.2] Wang Z., Chen J., Kocich R., Tardif S., Dolbnya I.P., Kunčická L., Micha J.S., Liogas K., Magdysyuk O.V., Szurman I., Korsunsky A.M., ACS Applied Materials & Interfaces 14, 31396-31410 (2022) https://doi.org/10.1021/acsami.2c05939

(52) “Twin boundary migration in an individual platinum nanocrystal during catalytic CO oxidation (Laue pattern)”

[U] [LAUE] [15.7] Carnis J., Kshirsagar A.R., Wu L., Dupraz M., Labat S., Texier M., Favre L., Gao L., Oropeza F.E., Gazit N., Almog E., Campos A., Micha J.S., Hensen E.J.M., Leake S.J., Schülli T.U., Rabkin E., Thomas O., Poloni R., Hofmann J.P., Richard M.I., Nature Communications 12, 5385-1-5385-10 (2021) http://dx.doi.org/10.1038/s41467-021-25625-0

(13) “Grain boundary formation through particle detachment during coarsening of nanoporous metals”

[U] [LAUE] [9.1] Elder K.L.M., Andrews W.B., Ziehmer M., Mameka N., Kirchlechner C., Davydok A., Micha J.-S., Chadwick A.F., Lilleodden E.T., Thornton K., Voorhees P.W., Proceedings of the National Academy of Sciences of the USA 118, e2104132118-1-e2104132118-10 (2021) http://dx.doi.org/10.1073/pnas.2104132118

(14) “Huge local elastic strains in bulk nanostructured pure zirconia materials”

[C] [LAUE] [7] Ors T., Gouraud F., Michel V., Huger M., Gey N., Micha J.S., Castelnau O., Guinebretière R. Materials Science and Engineering: A, 140817-1-140817-10 (2021)

http://dx.doi.org/10.1016/j.msea.2021.140817

(3) “Submicronic Laue diffraction to determine in‐depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10−5 resolution”

[C] [LAUE] [3.0] X. Biquard, P. Ballet, A. Tuaz, P. H. Jouneau, F. Rieutord , J. Synchrotron Rad. (2021). 28, 181-187 https://doi.org/10.1107/S1600577520013211

(11) “Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging”

[U] [LAUE] [2.4] F. Lauraux, S. Labat, S. Yehya, M.-I. Richard, S. J. Leake, T. Zhou, J.-S. Micha, O. Robach, O. Kovalenko, E. Rabkin, T. U. Schülli, O. Thomas and T. W. Cornelius, Crystals 2021, 11(3), 312; https://doi.org/10.3390/cryst11030312

(7) In‐situ force measurement during nano‐indentation combined with Laue microdiffraction

[U] [LAUE] [3.5] Lauraux F., Yehya S., Labat S., Micha J.S., Robach O., Kovalenko O., Rabkin E., Thomas O., Cornelius T.W., Nano Select 2, 99-106 (2021) http://dx.doi.org/10.1002/nano.202000073

(9) VHCF damage in duplex stainless steel revealed by microbeam energy-dispersive X-ray Laue diffraction

[U] [LAUE] [6.8] Abboud A., AlHassan A., Dönges B., Micha J.S., Hartmann R., Strüder L., Christ H.J., Pietsch U., International Journal of Fatigue 151, 106358-1-106358-10 (2021) http://dx.doi.org/10.1016/j.ijfatigue.2021.106358

(7) “Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire”

[C] [LAUE] [2.8] A. AlHassan, A. Abboud, T. W. Cornelius, Z. Ren, O. Thomas, G. Richter, J.-S. Micha, S. Send, R. Hartmann, L. Strüder and U. Pietsch “Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire”, Journal of Applied Crystallography (2021) 54, 80-86

https://doi.org/10.1107/S1600576720014855

[LT] Michaud L.G., Castán C., Zussy M., Montméat P., Mareau V.H., Gonon L., Fournel F., Rieutord F., Tardif S. -” Elaboration and characterization of a 200 mm stretchable and flexible ultra-thin semi-conductor film” Nanotechnology 31, 145302-1-145302-7 (2020) http://dx.doi.org/10.1088/1361-6528/ab647a

[LT] Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O. -” First stages of plasticity in three-point bent Au nanowires detected by in situ Laue microdiffraction” Applied Physics Letters 116, 243101-1-243101-6 (2020) http://dx.doi.org/10.1063/5.0012816

[LT] Hektor, Johan, Jean-Sébastien Micha, Stephen A. Hall, Srinivasan Iyengar, and Matti Ristinmaa. “Long Term Evolution of Microstructure and Stress around Tin Whiskers Investigated Using Scanning Laue Microdiffraction.” Acta Materialia 168 (2019): 210–21. https://doi.org/10.1016/j.actamat.2019.02.021.

[LT] Plancher, Emeric, Pouya Tajdary, Thierry Auger, Olivier Castelnau, Véronique Favier, Dominique Loisnard, Jean-Baptiste Marijon, et al. “Validity of Crystal Plasticity Models Near Grain Boundaries: Contribution of Elastic Strain Measurements at Micron Scale.” JOM 71, no. 10 (2019): 3543–51 https://doi.org/10.1007/s11837-019-03711-5.

[LT] Cornelius, Thomas W., and Olivier Thomas. “Progress of in Situ Synchrotron X-Ray Diffraction Studies on the Mechanical Behavior of Materials at Small Scales.” Progress in Materials Science 94 (2018): 384–434. https://doi.org/10.1016/j.pmatsci.2018.01.004.

[LT] Hektor, Johan, Jean-Baptiste Marijon, Matti Ristinmaa, Stephen A. Hall, Håkan Hallberg, Srinivasan Iyengar, Jean-Sébastien Micha, Odile Robach, Fanny Grennerat, and Olivier Castelnau. “Evidence of 3D Strain Gradients Associated with Tin Whisker Growth.” Scripta Materialia 144 (2018): 1–4 https://doi.org/10.1016/j.scriptamat.2017.09.030.

[LT] Altinkurt, G., M. Fèvre, G. Geandier, M. Dehmas, O. Robach, and J.-S. Micha. “Local Strain Redistribution in a Coarse-Grained Nickel-Based Superalloy Subjected to Shot-Peening, Fatigue or Thermal Exposure Investigated Using Synchrotron X-Ray Laue Microdiffraction.” Journal of Materials Science 53, no. 11 (2018): 8567–89 https://doi.org/10.1007/s10853-018-2144-4.

[LT] Ors, T., J.-S. Micha, N. Gey, V. Michel, O. Castelnau, and R. Guinebretiere. “EBSD-Assisted Laue Microdiffraction for Microstrain Analysis.” Journal of Applied Crystallography 51, no. 1 (2018): 55–67. https://doi.org/10.1107/S1600576717017150.

[LT] Shin, J., T. W. Cornelius, S. Labat, F. Lauraux, M.-I. Richard, G. Richter, N. P. Blanchard, D. S. Gianola, and O. Thomas. “In Situ Bragg Coherent X-Ray Diffraction during Tensile Testing of an Individual Au Nanowire.” Journal of Applied Crystallography 51, no. 3 (2018): 781–88. https://doi.org/10.1107/S1600576718004910.

[LT] Boullier, Anne-Marie, Odile Robach, Benoît Ildefonse, Fabrice Barou, David Mainprice, Tomoyuki Ohtani, and Koichiro Fujimoto. “High Stresses Stored in Fault Zones: Example of the Nojima Fault (Japan).” Solid Earth 9, no. 2 (2018): 505–29 https://doi.org/10.5194/se-9-505-2018.

[LT] Ren, Z., T. W. Cornelius, C. Leclere, A. Davydok, J.-S. Micha, O. Robach, G. Richter, and O. Thomas. “Three-Point Bending Behavior of a Au Nanowire Studied by in-Situ Laue Micro-Diffraction.” Journal of Applied Physics 124, no. 18 (2018): 185104 https://doi.org/10.1063/1.5054068

[LT]Ren, Z., T. W. Cornelius, C. Leclere, A. Davydok, J.-S. Micha, O. Robach, G. Richter, and O. Thomas. “Plasticity in Inhomogeneously Strained Au Nanowires Studied by Laue Microdiffraction.” MRS Advances 3, no. 39 (ed 2018): 2331–39 https://doi.org/10.1557/adv.2018.465

[LT] Malyar, N. V., J. -S. Micha, G. Dehm, and C. Kirchlechner. “Dislocation-Twin Boundary Interaction in Small Scale Cu Bi-Crystals Loaded in Different Crystallographic Directions.” Acta Materialia 129 (2017): 91–97 https://doi.org/10.1016/j.actamat.2017.02.067.

[LT] Malyar, N. V., J. S. Micha, G. Dehm, and C. Kirchlechner. “Size Effect in Bi-Crystalline Micropillars with a Penetrable High Angle Grain Boundary.” Acta Materialia 129 (2017): 312–20 https://doi.org/10.1016/j.actamat.2017.03.003.

[LT] Reboud, V., A. Gassenq, J. M. Hartmann, J. Widiez, L. Virot, J. Aubin, K. Guilloy, et al. “Germanium Based Photonic Components toward a Full Silicon/Germanium Photonic Platform.” Progress in Crystal Growth and Characterization of Materials 63, no. 2 (2017): 1–24. https://doi.org/10.1016/j.pcrysgrow.2017.04.004.

Abboud, A., C. Kirchlechner, J. Keckes, T. Conka Nurdan, S. Send, J. S. Micha, O. Ulrich, R. Hartmann, L. Strüder, and U. Pietsch. “Single-Shot Full Strain Tensor Determination with Microbeam X-Ray Laue Diffraction and a Two-Dimensional Energy-Dispersive Detector.” Journal of Applied Crystallography 50, no. 3 (2017): 901–8. https://doi.org/10.1107/S1600576717005581.

[LT] Altinkurt, G., M. Fèvre, O. Robach, J.-S. Micha, G. Geandier, and M. Dehmas. “Full Elastic Strain Tensor Determination at the Phase Scale in a Powder Metallurgy Nickel-Based Superalloy Using X-Ray Laue Microdiffraction.” Journal of Applied Crystallography 50, no. 6 (2017): 1754–65. https://doi.org/10.1107/S1600576717014558.

[LT] Plancher, E., V. Favier, C. Maurice, E. Bosso, N. Rupin, J. Stodolna, D. Loisnard, et al. “Direct Measurement of Local Constitutive Relations, at the Micrometre Scale, in Bulk Metallic Alloys.” Journal of Applied Crystallography 50, no. 3 (2017): 940–48. https://doi.org/10.1107/S1600576717006185.

Zhang, F. G., M. Bornert, J. Petit, and O. Castelnau. “Accuracy of Stress Measurement by Laue Micro­diffraction (Laue-DIC Method): The Influence of Image Noise, Calibration Errors and Spot Number.” Journal of Synchrotron Radiation 24, no. 4 (2017): 802–17. https://doi.org/10.1107/S1600577517006622.

[LT] Ibrahim, M., É. Castelier, H. Palancher, M. Bornert, S. Caré, and J. -S. Micha. “Mechanical Behaviour near Grain Boundaries of He-Implanted UO₂ Ceramic Polycrystals.” Journal of Nuclear Materials 483 (2017): 13–20. https://doi.org/10.1016/j.jnucmat.2016.10.044

[LT] Gassenq, A., S. Tardif, K. Guilloy, I. Duchemin, N. Pauc, J. M. Hartmann, D. Rouchon, et al. “Raman-Strain Relations in Highly Strained Ge: Uniaxial ⟨100⟩, ⟨110⟩ and Biaxial (001) Stress.” Journal of Applied Physics 121, no. 5 (2017): 055702 https://doi.org/10.1063/1.4974202.

 Guerain, Mathieu, Jean-Luc Grosseau-Poussard, Guillaume Geandier, Benoit Panicaud, Nobumichi Tamura, Martin Kunz, Catherine Dejoie, Jean-Sébastien Micha, Dominique Thiaudière, and Philippe Goudeau. “Residual Stress Determination in Oxide Layers at Different Length Scales Combining Raman Spectroscopy and X-Ray Diffraction: Application to Chromia-Forming Metallic Alloys.” Journal of Applied Physics 122, no. 19 (2017): 195105 https://doi.org/10.1063/1.4990146.

[LT] Tuaz, Aymeric, Philippe Ballet, Xavier Biquard, and François Rieutord. “Micro-Diffraction Investigation of Localized Strain in Mesa-Etched HgCdTe Photodiodes.” Journal of Electronic Materials 46, no. 9 (2017): 5442–47. https://doi.org/10.1007/s11664-017-5691-6.

[LT]Gassenq, A., S. Tardif, K. Guilloy, N. Pauc, M. Bertrand, D. Rouchon, J. M. Hartmann, et al. “High-Quality and Homogeneous 200-Mm GeOI Wafers Processed for High Strain Induction in Ge.” In Silicon Photonics XII, 10108:101081B. International Society for Optics and Photonics, (2017). https://doi.org/10.1117/12.2251790.

[LT] Philippi, Bastian, Christoph Kirchlechner, Jean Sébastien Micha, and Gerhard Dehm. “Size and Orientation Dependent Mechanical Behavior of Body-Centered Tetragonal Sn at 0.6 of the Melting Temperature.” Acta Materialia 115 (2016): 76–82 https://doi.org/10.1016/j.actamat.2016.05.055.

[LT] Guilloy, Kevin, Nicolas Pauc, Alban Gassenq, Yann-Michel Niquet, Jose-Maria Escalante, Ivan Duchemin, Samuel Tardif, et al. “Germanium under High Tensile Stress: Nonlinear Dependence of Direct Band Gap vs Strain.” ACS Photonics 3, no. 10 (2016): 1907–11 https://doi.org/10.1021/acsphotonics.6b00429.

[LT] Davydok, Anton, Balila Nagamani Jaya, Odile Robach, Olivier Ulrich, Jean-Sébastien Micha, and Christoph Kirchlechner. “Analysis of the Full Stress Tensor in a Micropillar: Ability of and Difficulties Arising during Synchrotron Based ΜLaue Diffraction.” Materials & Design 108 (2016): 68–75 https://doi.org/10.1016/j.matdes.2016.06.098.

[LT]Gassenq, A., S. Tardif, K. Guilloy, G. Osvaldo Dias, N. Pauc, I. Duchemin, D. Rouchon, et al. “Accurate Strain Measurements in Highly Strained Ge Microbridges.” Applied Physics Letters 108, no. 24 (2016): 241902 https://doi.org/10.1063/1.4953788.

[LT] Tardif, S., A. Gassenq, K. Guilloy, N. Pauc, G. Osvaldo Dias, J.-M. Hartmann, J. Widiez, et al. “Lattice Strain and Tilt Mapping in Stressed Ge Microstructures Using X-Ray Laue Micro-Diffraction and Rainbow Filtering.” Journal of Applied Crystallography 49, no. 5 (2016): 1402–11. https://doi.org/10.1107/S1600576716010347.

[LT] Leclere, C., T. W. Cornelius, Z. Ren, O. Robach, J.-S. Micha, A. Davydok, O. Ulrich, G. Richter, and O. Thomas. “KB Scanning of X-Ray Beam for Laue Microdiffraction on Accelero-Phobic Samples: Application to in Situ Mechanically Loaded Nanowires.”  Journal of Synchrotron Radiation 23, no. 6 (2016): 1395–1400. https://doi.org/10.1107/S1600577516013849.

[LT]Plancher, E., J. Petit, C. Maurice, V. Favier, L. Saintoyant, D. Loisnard, N. Rupin, et al. “On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: A Cross-Validation Experiment.” Experimental Mechanics 56, no. 3 (2016): 483–92 https://doi.org/10.1007/s11340-015-0114-1.

[LT] Auzelle, Thomas, Xavier Biquard, Edith Bellet-Amalric, Zhihua Fang, Hervé Roussel, Ana Cros, and Bruno Daudin. “Unraveling the Strain State of GaN down to Single Nanowires.” Journal of Applied Physics 120, no. 22 (2016): 225701 https://doi.org/10.1063/1.4971967.

[LT] Deluca, Marco, René Hammer, Jozef Keckes, Jochen Kraft, Franz Schrank, Juraj Todt, Odile Robach, Jean-Sébastien Micha, and Stefan Defregger. “Integrated Experimental and Computational Approach for Residual Stress Investigation near Through-Silicon Vias.” Journal of Applied Physics 120, no. 19 (2016): 195104. https://doi.org/10.1063/1.4967927

[LT] Jeffrey M. Wheeler, Christoph Kirchlechner, Jean-Sébastien Micha, Johann Michler & Daniel Kiener “The effect of size on the strength of FCC metals at elevated temperatures: annealed copper” Philosophical Magazine, 96:32-34, 3379-3395, (2016) https://doi.org/10.1080/14786435.2016.1224945

[LT] Vianne, B., S. Escoubas, C. Krauss, M. -I. Richard, S. Labat, G. Chahine, J. -S. Micha, et al. “Temperature Dependency of the Strain Distribution Induced by TSVs in Silicon: A Comparative Study between Micro-Laue and Monochromatic Nano-Diffraction.” Microelectronic Engineering, MAM (Materials for Advanced Metallization) 2015, 156 (2016): 59–64. https://doi.org/10.1016/j.mee.2016.03.003.

[LT] Sanchez, Dario Ferreira, Shay Reboh, Monica Larissa Djomeni Weleguela, Jean-Sébastien Micha, Odile Robach, Thierry Mourier, Patrice Gergaud, and Pierre Bleuet. “In-Situ X-Ray ΜLaue Diffraction Study of Copper through-Silicon Vias.” Microelectronics Reliability 56 (2016): 78–84 https://doi.org/10.1016/j.microrel.2015.10.008.

[LT]Guilloy, K., A. Gassenq, N. Pauc, J. Maria Escalante Fernandez, I. Duchemin, Y.-Michel Niquet, S. Tardif, et al. “Nonlinear Strain Dependences in Highly Strained Germanium Micromembranes for On-Chip Light Source Applications” In Silicon Photonics and Photonic Integrated Circuits V, 9891:98910X. International Society for Optics and Photonics, (2016) https://doi.org/10.1117/12.2227497.

[LT] Zabel, T; Marin, E; Geiger, R; Bozon, C; Tardif, S; Guilloy, K; Gassenq, A; Escalante, J; Niquet, YM; Duchemin, ”Highly strained direct bandgap Germanium cavities for a monolithic laser on Si Group IV Photonics (GFP)” 2016 IEEE 13th International Conference 40-41 (2016)

[LT] Gassenq, A; Guilloy, K; Tardif, S; Escalante, J; Niquet, YM; Duchemin, I; Hartmann, JM; Rouchon, D; Widiez, J; Rothman, J “Non-linear bandgap strain dependence in highly strained germanium using strain redistribution in 200 mm GeOI wafers for laser applications” Group IV Photonics (GFP), 2016 IEEE 13th International Conference, 104-105 (2016)

[LT] Guilloy, Kevin, Nicolas Pauc, Alban Gassenq, Pascal Gentile, Samuel Tardif, François Rieutord, and Vincent Calvo. “Tensile Strained Germanium Nanowires Measured by Photocurrent Spectroscopy and X-Ray Microdiffraction.” Nano Letters 15, no. 4 (2015): 2429–33 https://doi.org/10.1021/nl5048219.

[LT] Kirchlechner, C., P. J. Imrich, W. Liegl, J. Pörnbacher, J. -S. Micha, O. Ulrich, and C. Motz. “On the Reversibility of Dislocation Slip during Small Scale Low Cycle Fatigue.” Acta Materialia 94 (2015): 69–77 https://doi.org/10.1016/j.actamat.2015.04.029.

[LT] Ferreira Sanchez, D., J. Villanova, J. Laurencin, J.-S. Micha, A. Montani, P. Gergaud, and P. Bleuet. “X-Ray Micro Laue Diffraction Tomography Analysis of a Solid Oxide Fuel Cell.” Journal of Applied Crystallography 48, no. 2 (2015): 357–64. https://doi.org/10.1107/S1600576715002447.

[LT] Ibrahim, M., É Castelier, H. Palancher, M. Bornert, S. Caré, and J.-S. Micha. “Laue Pattern Analysis for Two-Dimensional Strain Mapping in Light-Ion-Implanted Polycrystals.” Journal of Applied Crystallography 48, no. 4 (2015): 990–99 https://doi.org/10.1107/S1600576715007736.

[LT] Leclere, C., T. W. Cornelius, Z. Ren, A. Davydok, J.-S. Micha, O. Robach, G. Richter, L. Belliard, and O. Thomas. “In Situ Bending of an Au Nanowire Monitored by Micro Laue Diffraction.” Journal of Applied Crystallography 48, no. 1 (2015): 291–96. https://doi.org/10.1107/S1600576715001107.

Zhang, F. G., O. Castelnau, M. Bornert, J. Petit, J. B. Marijon, and E. Plancher. “Determination of Deviatoric Elastic Strain and Lattice Orientation by Applying Digital Image Correlation to Laue Microdiffraction Images: The Enhanced Laue-DIC Method.” Journal of Applied Crystallography 48, no. 6 (2015): 1805–17. https://doi.org/10.1107/S1600576715018397.

[LT] Petit, J., O. Castelnau, M. Bornert, F. G. Zhang, F. Hofmann, A. M. Korsunsky, D. Faurie, et al. “Laue-DIC: A New Method for Improved Stress Field Measurements at the Micrometer Scale.” Journal of Synchrotron Radiation 22, no. 4 (2015): 980–94. https://doi.org/10.1107/S1600577515005780.

[LT] Fonović, Matej, Andreas Leineweber, Odile Robach, Eric A. Jägle, and Eric J. Mittemeijer. “The Nature and Origin of ‘Double Expanded Austenite’ in Ni-Based Ni-Ti Alloys Developing Upon Low Temperature Gaseous Nitriding.” Metallurgical and Materials Transactions A 46, no. 9 (2015): 4115–31 https://doi.org/10.1007/s11661-015-2999-9.

[LT] Vianne, B., C. Krauss, S. Escoubas, M.-I. Richard, S. Labat, G. Chahine, T. Schüllli, et al. “Effect of the Temperature on the Strain Distribution Induced in Silicon Interposer by TSVs: A Comparison between Micro-Laue and Monochromatic Nanodiffraction.” In 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 59–62, (2015) https://doi.org/10.1109/IITC-MAM.2015.7325626.

And Others 2006-2014 to be added

Laue Publications

[LT]  Data Analysis with LaueTools

[LT] Michaud L.G., Castán C., Zussy M., Montméat P., Mareau V.H., Gonon L., Fournel F., Rieutord F., Tardif S. -” Elaboration and characterization of a 200 mm stretchable and flexible ultra-thin semi-conductor film” Nanotechnology 31, 145302-1-145302-7 (2020) http://dx.doi.org/10.1088/1361-6528/ab647a

[LT] Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O. -” First stages of plasticity in three-point bent Au nanowires detected by in situ Laue microdiffraction” Applied Physics Letters 116, 243101-1-243101-6 (2020) http://dx.doi.org/10.1063/5.0012816

[LT] Hektor, Johan, Jean-Sébastien Micha, Stephen A. Hall, Srinivasan Iyengar, and Matti Ristinmaa. “Long Term Evolution of Microstructure and Stress around Tin Whiskers Investigated Using Scanning Laue Microdiffraction.” Acta Materialia 168 (2019): 210–21. https://doi.org/10.1016/j.actamat.2019.02.021.

[LT] Plancher, Emeric, Pouya Tajdary, Thierry Auger, Olivier Castelnau, Véronique Favier, Dominique Loisnard, Jean-Baptiste Marijon, et al. “Validity of Crystal Plasticity Models Near Grain Boundaries: Contribution of Elastic Strain Measurements at Micron Scale.” JOM 71, no. 10 (2019): 3543–51 https://doi.org/10.1007/s11837-019-03711-5.

[LT] Cornelius, Thomas W., and Olivier Thomas. “Progress of in Situ Synchrotron X-Ray Diffraction Studies on the Mechanical Behavior of Materials at Small Scales.” Progress in Materials Science 94 (2018): 384–434. https://doi.org/10.1016/j.pmatsci.2018.01.004.

[LT] Hektor, Johan, Jean-Baptiste Marijon, Matti Ristinmaa, Stephen A. Hall, Håkan Hallberg, Srinivasan Iyengar, Jean-Sébastien Micha, Odile Robach, Fanny Grennerat, and Olivier Castelnau. “Evidence of 3D Strain Gradients Associated with Tin Whisker Growth.” Scripta Materialia 144 (2018): 1–4 https://doi.org/10.1016/j.scriptamat.2017.09.030.

[LT] Altinkurt, G., M. Fèvre, G. Geandier, M. Dehmas, O. Robach, and J.-S. Micha. “Local Strain Redistribution in a Coarse-Grained Nickel-Based Superalloy Subjected to Shot-Peening, Fatigue or Thermal Exposure Investigated Using Synchrotron X-Ray Laue Microdiffraction.” Journal of Materials Science 53, no. 11 (2018): 8567–89 https://doi.org/10.1007/s10853-018-2144-4.

[LT] Ors, T., J.-S. Micha, N. Gey, V. Michel, O. Castelnau, and R. Guinebretiere. “EBSD-Assisted Laue Microdiffraction for Microstrain Analysis.” Journal of Applied Crystallography 51, no. 1 (2018): 55–67. https://doi.org/10.1107/S1600576717017150.

[LT] Shin, J., T. W. Cornelius, S. Labat, F. Lauraux, M.-I. Richard, G. Richter, N. P. Blanchard, D. S. Gianola, and O. Thomas. “In Situ Bragg Coherent X-Ray Diffraction during Tensile Testing of an Individual Au Nanowire.” Journal of Applied Crystallography 51, no. 3 (2018): 781–88. https://doi.org/10.1107/S1600576718004910.

[LT] Boullier, Anne-Marie, Odile Robach, Benoît Ildefonse, Fabrice Barou, David Mainprice, Tomoyuki Ohtani, and Koichiro Fujimoto. “High Stresses Stored in Fault Zones: Example of the Nojima Fault (Japan).” Solid Earth 9, no. 2 (2018): 505–29 https://doi.org/10.5194/se-9-505-2018.

[LT] Ren, Z., T. W. Cornelius, C. Leclere, A. Davydok, J.-S. Micha, O. Robach, G. Richter, and O. Thomas. “Three-Point Bending Behavior of a Au Nanowire Studied by in-Situ Laue Micro-Diffraction.” Journal of Applied Physics 124, no. 18 (2018): 185104 https://doi.org/10.1063/1.5054068

[LT]Ren, Z., T. W. Cornelius, C. Leclere, A. Davydok, J.-S. Micha, O. Robach, G. Richter, and O. Thomas. “Plasticity in Inhomogeneously Strained Au Nanowires Studied by Laue Microdiffraction.” MRS Advances 3, no. 39 (ed 2018): 2331–39 https://doi.org/10.1557/adv.2018.465

[LT] Malyar, N. V., J. -S. Micha, G. Dehm, and C. Kirchlechner. “Dislocation-Twin Boundary Interaction in Small Scale Cu Bi-Crystals Loaded in Different Crystallographic Directions.” Acta Materialia 129 (2017): 91–97 https://doi.org/10.1016/j.actamat.2017.02.067.

[LT] Malyar, N. V., J. S. Micha, G. Dehm, and C. Kirchlechner. “Size Effect in Bi-Crystalline Micropillars with a Penetrable High Angle Grain Boundary.” Acta Materialia 129 (2017): 312–20 https://doi.org/10.1016/j.actamat.2017.03.003.

[LT] Reboud, V., A. Gassenq, J. M. Hartmann, J. Widiez, L. Virot, J. Aubin, K. Guilloy, et al. “Germanium Based Photonic Components toward a Full Silicon/Germanium Photonic Platform.” Progress in Crystal Growth and Characterization of Materials 63, no. 2 (2017): 1–24. https://doi.org/10.1016/j.pcrysgrow.2017.04.004.

Abboud, A., C. Kirchlechner, J. Keckes, T. Conka Nurdan, S. Send, J. S. Micha, O. Ulrich, R. Hartmann, L. Strüder, and U. Pietsch. “Single-Shot Full Strain Tensor Determination with Microbeam X-Ray Laue Diffraction and a Two-Dimensional Energy-Dispersive Detector.” Journal of Applied Crystallography 50, no. 3 (2017): 901–8. https://doi.org/10.1107/S1600576717005581.

[LT] Altinkurt, G., M. Fèvre, O. Robach, J.-S. Micha, G. Geandier, and M. Dehmas. “Full Elastic Strain Tensor Determination at the Phase Scale in a Powder Metallurgy Nickel-Based Superalloy Using X-Ray Laue Microdiffraction.” Journal of Applied Crystallography 50, no. 6 (2017): 1754–65. https://doi.org/10.1107/S1600576717014558.

[LT] Plancher, E., V. Favier, C. Maurice, E. Bosso, N. Rupin, J. Stodolna, D. Loisnard, et al. “Direct Measurement of Local Constitutive Relations, at the Micrometre Scale, in Bulk Metallic Alloys.” Journal of Applied Crystallography 50, no. 3 (2017): 940–48. https://doi.org/10.1107/S1600576717006185.

Zhang, F. G., M. Bornert, J. Petit, and O. Castelnau. “Accuracy of Stress Measurement by Laue Micro­diffraction (Laue-DIC Method): The Influence of Image Noise, Calibration Errors and Spot Number.” Journal of Synchrotron Radiation 24, no. 4 (2017): 802–17. https://doi.org/10.1107/S1600577517006622.

[LT] Ibrahim, M., É. Castelier, H. Palancher, M. Bornert, S. Caré, and J. -S. Micha. “Mechanical Behaviour near Grain Boundaries of He-Implanted UO₂ Ceramic Polycrystals.” Journal of Nuclear Materials 483 (2017): 13–20. https://doi.org/10.1016/j.jnucmat.2016.10.044

[LT] Gassenq, A., S. Tardif, K. Guilloy, I. Duchemin, N. Pauc, J. M. Hartmann, D. Rouchon, et al. “Raman-Strain Relations in Highly Strained Ge: Uniaxial ⟨100⟩, ⟨110⟩ and Biaxial (001) Stress.” Journal of Applied Physics 121, no. 5 (2017): 055702 https://doi.org/10.1063/1.4974202.

 Guerain, Mathieu, Jean-Luc Grosseau-Poussard, Guillaume Geandier, Benoit Panicaud, Nobumichi Tamura, Martin Kunz, Catherine Dejoie, Jean-Sébastien Micha, Dominique Thiaudière, and Philippe Goudeau. “Residual Stress Determination in Oxide Layers at Different Length Scales Combining Raman Spectroscopy and X-Ray Diffraction: Application to Chromia-Forming Metallic Alloys.” Journal of Applied Physics 122, no. 19 (2017): 195105 https://doi.org/10.1063/1.4990146.

[LT] Tuaz, Aymeric, Philippe Ballet, Xavier Biquard, and François Rieutord. “Micro-Diffraction Investigation of Localized Strain in Mesa-Etched HgCdTe Photodiodes.” Journal of Electronic Materials 46, no. 9 (2017): 5442–47. https://doi.org/10.1007/s11664-017-5691-6.

[LT]Gassenq, A., S. Tardif, K. Guilloy, N. Pauc, M. Bertrand, D. Rouchon, J. M. Hartmann, et al. “High-Quality and Homogeneous 200-Mm GeOI Wafers Processed for High Strain Induction in Ge.” In Silicon Photonics XII, 10108:101081B. International Society for Optics and Photonics, (2017). https://doi.org/10.1117/12.2251790.

[LT] Philippi, Bastian, Christoph Kirchlechner, Jean Sébastien Micha, and Gerhard Dehm. “Size and Orientation Dependent Mechanical Behavior of Body-Centered Tetragonal Sn at 0.6 of the Melting Temperature.” Acta Materialia 115 (2016): 76–82 https://doi.org/10.1016/j.actamat.2016.05.055.

[LT] Guilloy, Kevin, Nicolas Pauc, Alban Gassenq, Yann-Michel Niquet, Jose-Maria Escalante, Ivan Duchemin, Samuel Tardif, et al. “Germanium under High Tensile Stress: Nonlinear Dependence of Direct Band Gap vs Strain.” ACS Photonics 3, no. 10 (2016): 1907–11 https://doi.org/10.1021/acsphotonics.6b00429.

[LT] Davydok, Anton, Balila Nagamani Jaya, Odile Robach, Olivier Ulrich, Jean-Sébastien Micha, and Christoph Kirchlechner. “Analysis of the Full Stress Tensor in a Micropillar: Ability of and Difficulties Arising during Synchrotron Based ΜLaue Diffraction.” Materials & Design 108 (2016): 68–75 https://doi.org/10.1016/j.matdes.2016.06.098.

[LT]Gassenq, A., S. Tardif, K. Guilloy, G. Osvaldo Dias, N. Pauc, I. Duchemin, D. Rouchon, et al. “Accurate Strain Measurements in Highly Strained Ge Microbridges.” Applied Physics Letters 108, no. 24 (2016): 241902 https://doi.org/10.1063/1.4953788.

[LT] Tardif, S., A. Gassenq, K. Guilloy, N. Pauc, G. Osvaldo Dias, J.-M. Hartmann, J. Widiez, et al. “Lattice Strain and Tilt Mapping in Stressed Ge Microstructures Using X-Ray Laue Micro-Diffraction and Rainbow Filtering.” Journal of Applied Crystallography 49, no. 5 (2016): 1402–11. https://doi.org/10.1107/S1600576716010347.

[LT] Leclere, C., T. W. Cornelius, Z. Ren, O. Robach, J.-S. Micha, A. Davydok, O. Ulrich, G. Richter, and O. Thomas. “KB Scanning of X-Ray Beam for Laue Microdiffraction on Accelero-Phobic Samples: Application to in Situ Mechanically Loaded Nanowires.”  Journal of Synchrotron Radiation 23, no. 6 (2016): 1395–1400. https://doi.org/10.1107/S1600577516013849.

[LT]Plancher, E., J. Petit, C. Maurice, V. Favier, L. Saintoyant, D. Loisnard, N. Rupin, et al. “On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: A Cross-Validation Experiment.” Experimental Mechanics 56, no. 3 (2016): 483–92 https://doi.org/10.1007/s11340-015-0114-1.

[LT] Auzelle, Thomas, Xavier Biquard, Edith Bellet-Amalric, Zhihua Fang, Hervé Roussel, Ana Cros, and Bruno Daudin. “Unraveling the Strain State of GaN down to Single Nanowires.” Journal of Applied Physics 120, no. 22 (2016): 225701 https://doi.org/10.1063/1.4971967.

[LT] Deluca, Marco, René Hammer, Jozef Keckes, Jochen Kraft, Franz Schrank, Juraj Todt, Odile Robach, Jean-Sébastien Micha, and Stefan Defregger. “Integrated Experimental and Computational Approach for Residual Stress Investigation near Through-Silicon Vias.” Journal of Applied Physics 120, no. 19 (2016): 195104. https://doi.org/10.1063/1.4967927

[LT] Jeffrey M. Wheeler, Christoph Kirchlechner, Jean-Sébastien Micha, Johann Michler & Daniel Kiener “The effect of size on the strength of FCC metals at elevated temperatures: annealed copper” Philosophical Magazine, 96:32-34, 3379-3395, (2016) https://doi.org/10.1080/14786435.2016.1224945

[LT] Vianne, B., S. Escoubas, C. Krauss, M. -I. Richard, S. Labat, G. Chahine, J. -S. Micha, et al. “Temperature Dependency of the Strain Distribution Induced by TSVs in Silicon: A Comparative Study between Micro-Laue and Monochromatic Nano-Diffraction.” Microelectronic Engineering, MAM (Materials for Advanced Metallization) 2015, 156 (2016): 59–64. https://doi.org/10.1016/j.mee.2016.03.003.

[LT] Sanchez, Dario Ferreira, Shay Reboh, Monica Larissa Djomeni Weleguela, Jean-Sébastien Micha, Odile Robach, Thierry Mourier, Patrice Gergaud, and Pierre Bleuet. “In-Situ X-Ray ΜLaue Diffraction Study of Copper through-Silicon Vias.” Microelectronics Reliability 56 (2016): 78–84 https://doi.org/10.1016/j.microrel.2015.10.008.

[LT]Guilloy, K., A. Gassenq, N. Pauc, J. Maria Escalante Fernandez, I. Duchemin, Y.-Michel Niquet, S. Tardif, et al. “Nonlinear Strain Dependences in Highly Strained Germanium Micromembranes for On-Chip Light Source Applications” In Silicon Photonics and Photonic Integrated Circuits V, 9891:98910X. International Society for Optics and Photonics, (2016) https://doi.org/10.1117/12.2227497.

[LT] Zabel, T; Marin, E; Geiger, R; Bozon, C; Tardif, S; Guilloy, K; Gassenq, A; Escalante, J; Niquet, YM; Duchemin, ”Highly strained direct bandgap Germanium cavities for a monolithic laser on Si Group IV Photonics (GFP)” 2016 IEEE 13th International Conference 40-41 (2016)

[LT] Gassenq, A; Guilloy, K; Tardif, S; Escalante, J; Niquet, YM; Duchemin, I; Hartmann, JM; Rouchon, D; Widiez, J; Rothman, J “Non-linear bandgap strain dependence in highly strained germanium using strain redistribution in 200 mm GeOI wafers for laser applications” Group IV Photonics (GFP), 2016 IEEE 13th International Conference, 104-105 (2016)

[LT] Guilloy, Kevin, Nicolas Pauc, Alban Gassenq, Pascal Gentile, Samuel Tardif, François Rieutord, and Vincent Calvo. “Tensile Strained Germanium Nanowires Measured by Photocurrent Spectroscopy and X-Ray Microdiffraction.” Nano Letters 15, no. 4 (2015): 2429–33 https://doi.org/10.1021/nl5048219.

[LT] Kirchlechner, C., P. J. Imrich, W. Liegl, J. Pörnbacher, J. -S. Micha, O. Ulrich, and C. Motz. “On the Reversibility of Dislocation Slip during Small Scale Low Cycle Fatigue.” Acta Materialia 94 (2015): 69–77 https://doi.org/10.1016/j.actamat.2015.04.029.

[LT] Ferreira Sanchez, D., J. Villanova, J. Laurencin, J.-S. Micha, A. Montani, P. Gergaud, and P. Bleuet. “X-Ray Micro Laue Diffraction Tomography Analysis of a Solid Oxide Fuel Cell.” Journal of Applied Crystallography 48, no. 2 (2015): 357–64. https://doi.org/10.1107/S1600576715002447.

[LT] Ibrahim, M., É Castelier, H. Palancher, M. Bornert, S. Caré, and J.-S. Micha. “Laue Pattern Analysis for Two-Dimensional Strain Mapping in Light-Ion-Implanted Polycrystals.” Journal of Applied Crystallography 48, no. 4 (2015): 990–99 https://doi.org/10.1107/S1600576715007736.

[LT] Leclere, C., T. W. Cornelius, Z. Ren, A. Davydok, J.-S. Micha, O. Robach, G. Richter, L. Belliard, and O. Thomas. “In Situ Bending of an Au Nanowire Monitored by Micro Laue Diffraction.” Journal of Applied Crystallography 48, no. 1 (2015): 291–96. https://doi.org/10.1107/S1600576715001107.

Zhang, F. G., O. Castelnau, M. Bornert, J. Petit, J. B. Marijon, and E. Plancher. “Determination of Deviatoric Elastic Strain and Lattice Orientation by Applying Digital Image Correlation to Laue Microdiffraction Images: The Enhanced Laue-DIC Method.” Journal of Applied Crystallography 48, no. 6 (2015): 1805–17. https://doi.org/10.1107/S1600576715018397.

[LT] Petit, J., O. Castelnau, M. Bornert, F. G. Zhang, F. Hofmann, A. M. Korsunsky, D. Faurie, et al. “Laue-DIC: A New Method for Improved Stress Field Measurements at the Micrometer Scale.” Journal of Synchrotron Radiation 22, no. 4 (2015): 980–94. https://doi.org/10.1107/S1600577515005780.

[LT] Fonović, Matej, Andreas Leineweber, Odile Robach, Eric A. Jägle, and Eric J. Mittemeijer. “The Nature and Origin of ‘Double Expanded Austenite’ in Ni-Based Ni-Ti Alloys Developing Upon Low Temperature Gaseous Nitriding.” Metallurgical and Materials Transactions A 46, no. 9 (2015): 4115–31 https://doi.org/10.1007/s11661-015-2999-9.

[LT] Vianne, B., C. Krauss, S. Escoubas, M.-I. Richard, S. Labat, G. Chahine, T. Schüllli, et al. “Effect of the Temperature on the Strain Distribution Induced in Silicon Interposer by TSVs: A Comparison between Micro-Laue and Monochromatic Nanodiffraction.” In 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 59–62, (2015) https://doi.org/10.1109/IITC-MAM.2015.7325626.

And Others 2006-2014 to be added