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UOC Event: Grain Mapping by Scanning Diffraction Tomography

QUICK INFORMATION
Type
Workshop
Start Date
31-05-2027 08:00
End Date
02-06-2027 17:30
Location
ESRF Auditorium
Email
gm2027@esrf.fr
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Coordinator contact(s)
Véronique Béguin

Scientific contact(s)
Tilman Grünewald
Alberto Martinelli
Jonathan Wright, Haixing Fang & James Ball

This ESRF User Organisation Committee (UOC) school will provide foundational training and hands-on data-analysis tutorials for users who have recently carried out scanning 3D X-ray diffraction (s3DXRD) or texture tomography (TexTOM) experiments at the ESRF at beamlines like ID11, ID13 or ID3. Both techniques use the same scanning-diffraction measurements to map non-destructively, in three dimensions, the orientations and lattice strains of the crystal grains inside a material: s3DXRD resolves individual grains in detail, while TexTOM handles more strongly deformed microstructures. The school will also give participants a forum to discuss the new scientific opportunities opened by the upgrade of ID11, one of the ESRF’s main grain-mapping beamlines.