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- In Situ Nanostructure and Surface (INS)
The INS station is the third and last experimental station. It is devoted to studies of surfaces, interfaces and thin films in Ultra High Vacuum, by means of three techniques using hard X-rays: Grazing Incidence X-ray Scattering (GIXS), Surface Extended X-ray Absorption Spectroscopy (SEXAFS, ReflEXAFS) and X-ray Reflectivity. It is made of a large and well-equipped UHV chamber mounted on a 4-circle diffractometer for X-ray studies, coupled to several other UHV chambers located outside the X-ray hutch, which have been added by the local team, and are thus not opened to external users unless a strong collaboration is initiated.
The diffractometer supports the UHV chamber, with allowance for a rotation of the whole chamber defining the incidence angle (a) of the X-ray beam with respect to the vertical sample surface. A goniometric head allows alignment (two perpendicular tilts (c1 and c2), two translations (X, Z)) of the sample inside vacuum. The rotary motion of the sample is obtained through the rotation of the whole goniometric head thanks to a differentially pumped rotary feedthrough (w). Two sample surface orientations (parallel and perpendicular) with respect to the X-ray beam polarization are possible. Two circles of the diffractometer are devoted to the two detector rotations defining the Bragg angle projections parallel and perpendicular to the surface (d and b respectively). The x-ray UHV chamber has large Be windows giving access to large perpendicular momentum transfers (up to 45° input and exit angles). It is equipped with several sources (up to six simultaneously) for in situ epitaxial deposition and with standard UHV preparation and analysis tools (high temperature furnace, Reflection High Energy Electron Diffraction (RHEED), Auger Electron Spectroscopy (AES), Residual Gas Analysis (RGA), Ion Sputtering (IS), quartz micro-balance for calibration of deposition). Simultaneous real-time analysis with x-ray diffraction and RHEED and Auger spectroscopy can be performed during (co)deposition and/or annealing of ultra-thin films.
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Photograph of the X-ray station of the INS setup. The beam comes in through a small Be window (the right hand side) and exits through a large Be exit window. |
Goniometer | Sample holder (hexapod) | |||||
Circle | incidence (deg) |
out-of-plane |
in-plane scattering (deg) |
sample azimuth (deg) |
cradle (deg) |
translation (mm) |
Mechanical resolution |
0.0007 | 0.006 | 0.001 | 0.0005 | 0.001 | 0.001 |
Range | -1/+20 | -1/+45 | -13/+126 | ±200 | ±5 | ±5 |
Concentricity (µm) | ~30 | ~30 | ~20 | |||
Encoder resolution | 0.0004 | 0.0003 | 0.0004 | 0.00004 | ||
Repeatability | 0.001 | 0.001 | 0.001 | 0.001 | 0.002 | 0.005 |
INS is not only limited to the x-ray station. It is a large experimental set-up, schematically shown in the Figure, which has been continuously upgraded and improved by a CNRS/Cristallography and CEA/SP2M laboratory staff. The non x-ray equipments are : a complete MBE system devoted to nitride and Si/Ge growth, and a characterisation chamber equipped with quantitative LEED and Auger analysis, both connected in UHV via a large transfer system crossing the lead wall of the x-ray hutch. The MBE chamber was the first to be connected to the X-ray station. For samples which could not be produced in the X-ray chamber, the transfer system has been used successfully and some experiments were already carried out.
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Schematic drawing of the complete SUV setup. |
Specific properties when compared to other surface diffraction stations at ESRF: