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- BM32 - IF - InterFace Beamline, French CRG
- BM32 Beamline Instruments & Optics
Study of interfaces and surfaces at air or under ultra high vacuum by X-ray scattering techniques
Bending magnet - see Characteristics of bending magnet source BM32 at ESRF
source size |
less than 0.3x0.1 mm2 (HxV) FWHM |
vert. source divergence | 0.13 mrad at 20 keV |
total horiz.ang.acceptance | 2.8 mrad |
Optical Hutch
From right to left (X-ray beam travel direction): attenuator and slits (HxV)
mirror 1
monochromator
mirror 2
micrometric slits (pink beam mode)
optical elements | mirror 1 | double-crystal mono. |
mirror 2 |
distance from source | 26 m | 28 m | 30 m |
focusing type | vert.collim.or foc. Ir-coating |
horiz.(sagital)foc. Si(111) |
vert. foc. Ir-coating |
working angle | 0-7 mrad | 0-25 deg. | 0-10 mrad |
beam size at sample | position (1:1) : 0.5x0.3 mm2 (HxV) | ||
spectral range | 7-30 keV | ||
energy resolution in ![]() |
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flux at sample | ![]() |
Optics (pink beam mode)
optical elements | mirror 1 | mirror 2 | secondary source |
two Kirkpatrick-Baez (Pt) mirrors |
distance from source | 26 m | 30 m | 35 m | 60 m |
Optical function | vert. foc. Ir-coating |
vert. foc. Ir-coating |
20X20 µm2 | vert.+horiz. foc. |
working angle | 3.65mrad | 3.65 mrad | 2.9 mrad | |
beam size at sample | 0.5x0.7 µm2 (HxV) FWHM | |||
pink beam spectral range | 5-25 keV | |||
estimated flux at sample | approx. 10^11 photons/sec in standard monochromatic conditions |
Three instruments:
INS: In Situ Nanostructures and Surfaces (UHV)
MicroDiff: Laue Microdiffraction setup