Alpers A., Fiedler M., Gritzmann P., Klemm F.,
Philosophical Magazine 103, 948-968 (2023)
- Home
- Users & Science
- Find a beamline
- Structure of materials
- ID11 - Materials science beamline
G. Vaughan et al., "The extension of ID11 for nanoscale and hierarchical characterization", in Proceedings of the 31st Risoe International Symposium on Materials Science, 2010.
Alpers A., Fiedler M., Gritzmann P., Klemm F.,
Philosophical Magazine 103, 948-968 (2023)
Bardelli F., Giacobbe C., Ballirano P., Borelli V., Di Benedetto F., Montegrossi G., Bellis D., Pacella A.,
Environmental Geochemistry and Health 45, 5039-5051 (2023)
Chen Y., Tang Y.T., Collins D.M., Clark S.J., Ludwig W., Rodríguez-Lamas R., Detlefs C., Reed R.C., Lee P.D., Withers P.J., Yildirim C.,
Scripta Materialia 234, 115579-1-115579-6 (2023)
Fang H., Hovad E., Zhang Y., Jensen D.J.,
Materials Characterization 201, 112983-1-112983-11 (2023)
Fang H., Ludwig W., Lhuissier P.,
Journal of Applied Crystallography 56, 810-824 (2023)
Giacobbe C., Moliterni A., Di Giuseppe D., Malferrari D., Wright J.P., Mattioli M., Raneri S., Giannini C., Fornasini L., Mugnaioli E., Ballirano P., Gualtieri A.F.,
IUCrJ 10, 397-410 (2023)
Add this RSS feed to your favorite RSS reader (Thunderbird, Outlook etc...) or install an add-on to your browser, such as RSSPreview for Firefox