Beck L., Messager C., Caffy I., Gonzalez V., Cotte M., Foy E., Bonnaillie P., Maury C.,
Heritage 9, 128-1-128-14 (2026)
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- ID13 - Microfocus Beamline
The available beam parameters such as spot size, divergence, and flux vary with the incident photon energy (e.g. highest flux available close to standard energies 13 keV). In SAXS with nanobeam scanning, minimum q is coupled with beam size. Various combinations of scanning mode, beam size, and fluorescence mode are available depending on the technique chosen.
Beck L., Messager C., Caffy I., Gonzalez V., Cotte M., Foy E., Bonnaillie P., Maury C.,
Heritage 9, 128-1-128-14 (2026)
Calandra S., Cantisani E., Salvadori B.,
Talanta 299, 129076-1-129076-11 (2026)
Cantamessa A., Schemenz V., Blouin S., Volders T., Amini S., Rummler M., Liu J., Berzlanovich A., Weinkamer R., Wagermaier W., Hartmann M.A., Ruffoni D.,
Small Structures 7, e202500612-1-e202500612-17 (2026)
Faka V., Alabdali M., Lange M.A., Zanotto Z.M., Yildirim C., Kanedal M.D., Kondek J., Hartmann M., Maus O., Daisenberger D., Hansen M.R., Keckes J., Rettenwander D., Franco A.A., Zeier W.G.,
Advanced Energy Materials 16, e05186-1-e05186-15 (2026)
Hårberg S.B., Grendal O.G., Williamson B.A.D., Strand H., Burghammer M., Hvidsten S., Einarsrud M.A.,
Journal of Physics: Energy 8, 015016-1-015016-9 (2026)
Raven L., Gestels A., van Loon A., Avranovich Clerici E., van Duijn E., Almasian M., Vanmeert F., De Meyer S., Gonzalez V., Janssens K., Keune K.,
npj Heritage Science 14, 130-1-130-13 (2026)
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