Full-field hard x-ray microscopy is a non-destructive technique for investigating the micro- and nanostructure of materials. It will offer the opportunity to study bulk properties in mm-sized samples in 3D, using adapted tomographic techniques. The ability to directly characterize complex, multi-scale phenomena in situ is a key step towards formulating and validating multi-scale models that account for the entire heterogeneity of a material.

Scientific spokesperson:
Henning Friis Poulsen; Technical University of Denmark, Lyngby, Denmark

Expert panel:
Semën Gorfman; University of Siegen, Siegen, Germany
Roger Hubert; Research Centre for the Application of Steel, Zelzate, Belgium
Vanessa Schoeppler; Center for Molecular Bioengineering, Dresden, Germany

SAC observer:
Laszlo Vincze; Ghent University, Ghent, Belgium

ESRF coordinator:
Carsten Detlefs; ESRF, ID06

Registration to this workshop is closed. Programme available here.

Contact: ebs-science