XOP Functionality


This page lists most of the XOP Applications.


See the  Extensions entry for information on XOP extensions.


Source simulations

 XOP has many tools to simulate x-ray sources. Most of them are for synchrotron radiation sources (spectral emission, angular and spatial distributions, etc.), but some other programs may also simulate the emission spectra of some x-ray tubes. Other applications may be useful for spectral calculations using some well-known typical distributions.

  • Undulator Spectrum (XUS, XURGENT)
  • Undulator Tuning Curves (XTC)
  • Tapered Undulators (XYAUP)
  • Wiggler Radiation (XWIGGLER, WS)
  • Bending Magnet Radiation (BM and WS)
  • X-ray tubes (XTUBE_W, XTUBES)


Characteristics of optical elements


The applications in this group deal with calculations of the interactions of x-ray beams with optical elements or components. Typical cases are mirrors, multilayers and crystals.


All these applications require the calculation of the refraction index and attenuation coefficient of the materials in use. These calculations cannot be done quickly from first principles, therefore we have compiled a data base (DABAX, DAtaBAse for X-ray applications) with the "ingredients" of these parameters. One of the advantages of DABAX is the decoupling of the data from the calculations. We can easily change the files in the database without needing to change the programs. Furthermore, we included in most programs a menu that allows the user to chose the preferred data file.

  • DABAX: xf1f2 (f1,f2 scat fact, refraction index, reflectivity)
  • DABAX: xCrossSec (Cross section/absorption)
  • DABAX: xFh (Crystal Structure Factors)
  • DABAX: xf0 (f0 scattering factor)
  • Combination of the mirror and filter effect on a source spectrum (XPOWER).
  • Multilayer reflectivity (MLAYER)
  • Diffraction of (flat) perfect (XCRYSTAL, XINPRO), bent (Multilamellar, Penning-Polder  theories in XCRYSTAL) and  mosaic crystals (XCRYSTAL)
  • Unweganregung peak location in crystals: spaghetti, umweganregung and glitches plots (MARE)
  • Diffraction pattern of powder samples (XPOWDER, XPOWDER_FML)
  • Compound refractive lenses (CRL)


Data visualization and data analysis 


1D data (XY plots)

XPLOT is a general package for creating X-Y plots that also allows for

sophisticated data visualization, processing, manipulation and analysis.

Some features are:


  •  Direct loading of data from multicolumn ASCII data files. Access and merge multiple sets of data.
  • Access to SPEC data files.
  • Direct printing from workstations and PCs. PostScript and
  • Encapsulated PostScrip outputs.
  • Linear and logarithmic X- and Y-axes.
  • Apply and change symbols, line styles, colors, thickness, fonts,  etc.
  • Label, annotate, add legends, titles, etc. to the plots.
  • Zoom, shift, switch columns, and over-plot data.
  • Save and restore plots and attributes in a XPLOT backup file.
  • Data analysis: extrema, moments, integrals, derivatives, CDFs,
  • smoothing, user-defined operations, interactive Fourier Filtering,
  •  interpolations, convolutions and correlations.
  • Fitting: linear regression, polynomial fit, Gaussian fit and
  • Non-linear fit (Levenberg-Marquardt and others) whith an on-line user-defined function.)


 2D data (images)


XPLOT2D is a software tool for the analysis of scientific images.


Some features are:


  • Load and visualize several images

  • Several file types: EDF, MAR, BINARY, XRD, etc.

  • Automatically handles gzip MAR compressed files

  • Loads multiple files

  • When an image is load, it can be added to the image stack or substitute the first image in the stack.

  • Visualize images in frames.

  • Apply several color tables and adjust their limits to data.

  • Apply automatically different  color schemes (full range, stretched range, lin/log)

  • Define ROIS (rectangle, circle, cake, polygon)

  • Mask data

  • Allows non interactive use

  • One level undo

  • Calculations:

    • histograms

    • horizontal or vertical integration, etc.

    • horizontal, vertical and transversal profiles

    • Makes a generic operation with one image.

  • Diffraction simulations:

    • Overplot reference rings from external x-ray diffraction profiles, defined in with either "twotheta" or "d-spacing" files.

    • Full calibration using circles (detector perpendicular to beam) or ellipses (detector oblique to the beam)

    • azimuthal integration