Synopsis

X-ray Magnetic Circular Dichroism (XMCD) branch with high field superconducting magnet, variable X-ray spot size at the sample, coupled to a RIXS spectrometer and surface science preparation facility. A separate Materials Science chamber can be used for catalysts, batteries etc. studies and can also be coupled to the RIXS spectrometer.

Resonant Inelastic X-ray Scattering (RIXS) branch with very high resolving power (aim combined RP=30000) and 10m spectrometer with constant variable scattering angle over 100 degrees.

Open experimental area with the possibility of installing user chambers or using beamline instruments for example for soft x-ray diffraction or coherence experiments.

Disciplines

• Physics
• Materials and Engineering
• Chemistry

Applications

• Magnetism
• Electronic Structure
• Materials (e.g. batteries, catalysts)

Techniques

• REXS - Resonant Elastic X-ray Scattering
• RIXS - Resonant Inelastic X-ray Scattering
• RXES - Resonant X-ray Emission Spectroscopy
• XAS - X-ray Absorption Spectroscopy
• XANES - X-ray Absorption Near Edge Structure
• XLD - X-ray Linear Dichroism
• XMCD - X-ray Magnetic Circular Dichroism
• XMLD - X-ray Magnetic Linear Dichroism

Sample environments

• XMCD:
• 9T high magnetic field along the beam direction - split coil
• 4T high magnetic field perpendicular to the beam direction
• UHV sample environment - 10-10mbar range
• Sample temperature 6-300K
• Fast sweeping (4-8T/minute)
• RIXS:
• sample goniometer
• sample temperature ~20-300K
• scattering angles 149.5 (back scattering) -50 (forward scattering) degrees

Detectors

• XMCD Branch:
• Total electron yield - drain current measurement
• Total fluorescence yield - photodiode
• Partial fluorescence yield - RIXS detector
• RIXS detector arm - CMOS camera
• RIXS Branch:
• Total electron yield - drain current measurement
• Total fluorescence yield - photodiode
• RIXS detector arm - CCD camera

The beamline ID32 at the ESRF for soft X-ray high energy resolution resonant inelastic X-ray scattering and polarization dependent X-ray absorption spectroscopy
N.B. Brookes, F. Yakhou-Harris, K. Kummer, A. Fondacaro, J.C. Cezar,D. Betto, E. Velez-Fort, A. Amorese, G. Ghiringhelli, L. Braicovich, R. Barrett, G. Berruyer, F.Cianciosi, L. Eybert, P. Marion, P. van der Linden, L. Zhang
Nucl. Instrum. Methods A 903, 175 (2018).

https://doi.org/10.1016/j.nima.2018.07.001