ESRF - EBS Workshop Series


Workshop on
Dark Field X-ray Microscopy for EBSL2

ESRF - Grenoble - France
6-7 May 2021

Venue   Webinar via zoom

Carsten Detlefs, Can Yildrim, ESRF Grenoble
Henning F. Poulsen, Technical University of Denmark


Eva Jahn, ESRF Grenoble
Eleanor Ryan, ESRF Grenoble


Registration is now open


Dark-field x-ray microscopy is a newly developed technique to measure orientation and strain in crystalline materials with spatial resolution down to 100 nm. At the end of the EBS shutdown, Beamline ID06 HXRM will be the first instrument worldwide to offer this technique via a general user programme. Furthermore, the project has been selected as one of the Upgrade Beamlines, EBSL2, to be constructed on ID03.

The aim of this workshop is to present this new instrument and seed a new user community. Via discussions with potential users, we aim to determine the needs of future users for instrumentation such as sample environments, auxiliary measurements, sample preparation, etc.




Registrations will be open here until 30th April.

Call for abstracts

You find the instructions here


Submission of abstracts for contributed talks: 23/04/2021

Confirmation for oral contributions: 28/04/2021

Registration: 30/04/2021

This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No 870313.