The beamline provides a high-brilliance beam focused down to nanometer size, allowing quantitative 3D characterization of the morphology and the elemental composition of specimens in their native state by combining coherent imaging techniques and X-ray fluorescence microscopy.


Nano-imaging Beamline

The beamline is part of the ESRF Upgrade project UPBL4 NINA. The 185 m long beamline provides nano-focused beams for analytical imaging. The nano-imaging beamline addresses problems in biology, biomedicine and nano-technology using X-ray fluorescence microscopy and nano-tomography. It is optimised for ultimate hard X-ray focusing of a beam with a large energy bandwidth at specific energies (17keV or 33.6 keV). Cryogenic sample preservation is available for 2D and 3D imaging.


  • Life Sciences
  • Medicine
  • Materials and Engineering
  • Environmental Sciences
  • Earth and Planetary Sciences
  • Physics


  • Biomedicine
  • Environmental sciences
  • Energy
  • Nanotechnology
  • Advanced materials

Energy range
17.0 - 33.6  keV

Beam size
Minimum (H x V)
30 x 30   nm²
Maximum (H x V)
400 x 400   µm²






  • coherent imaging
  • phase-contrast imaging
  • near-field and far-field ptychography
  • X-ray fluorescence microscopy
  • scanning transmission X-ray microscopy
  • nanotomography


  • Fluorescence: two six elements silicon drift diode detectors
  • Imaging 1: high-resolution imaging detector lens-coupled to a FReLoN F_K4320 (2048x2048 pixels, 1.1 um pixel size)
  • Imaging 2: high-resolution imaging detector lens-coupled to a FReLoN F_E230-84 (4096x4096 pixels, 1.5 um pixel size) and to a SVCam-HR16070 (4864x3232 pixels, 1.5 um pixel size)
  • Far-field Ptychography: hybrid detector with four modules MAXIPIX detector