Synopsis
The beamline provides a high-brilliance beam focused down to nanometer size, allowing quantitative 3D characterization of the morphology and the elemental composition of specimens in their native state by combining coherent imaging techniques and X-ray fluorescence microscopy.
Status:
open
Disciplines
- Materials and Engineering
- Medicine
- Environmental Sciences
- Earth and Planetary Sciences
- Physics
- Life Sciences
Applications
- Biomedicine
- Environmental sciences
- Energy
- Nanotechnology
- Advanced materials
Techniques
-
Coherent imaging
-
Tomography
-
MicroXRF - micro X-ray fluorescence
-
Scanning transmission X-ray microscopy
-
Imaging, phase-contrast
Beam size
- Minimum (H x V) : 30.0
x 30.0
nm²
-
Maximum (H x V) : 400.0
x 400.0
µm²
Detectors
- Fluorescence: two six elements silicon drift diode detectors
- Imaging 1: high-resolution imaging detector lens-coupled to a FReLoN F_K4320 (2048x2048 pixels, 1.1 um pixel size)
- Imaging 2: high-resolution imaging detector lens-coupled to a FReLoN F_E230-84 (4096x4096 pixels, 1.5 um pixel size) and to a SVCam-HR16070 (4864x3232 pixels, 1.5 um pixel size)
- Far-field Ptychography: hybrid detector with 4 modules MAXIPIX detector