InN thin film lattice dynamics revealed by grazing incidence inelastic x-ray scattering


A combination of grazing incidence scattering and IXS from phonons, was used to measure the spectrum of lattice vibrations in a 6-micron-thick sample of indium nitride.

  • Share

InN Thin film lattice dynamics by grazing incidence inelastic X-ray scattering,
J. Serrano, A. Bosak, M. Krisch, F. J. Manjón, A. H. Romero, N. Garro, X. Wang, A. Yoshikawa, and M. Kuball, Phys. Rev. Lett. 106, 205501 (2011).