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Technical specifications
|
operational Sept. 1994 |
| scientific applications |
XAS, Surface XAS |
|
| source characteristics |
bending magnet ec = 19.2 keV |
| source size 0.187 x 0.128 mm2 (HxV) FWHM | |
| source divergence 115 x 5 µrad2 (HxV) FWHM | |
| divergence for photon source(ec) dF =3.6 mrad, sR=50 µrad | |
| peak brightness 7·1013 ph s-1mrad-2 (0.1% bw, 0.1A) | |
| power (from 3.6 mrad of the source) 225 W FWHM | |
| power density at 25 m 0.83 Wmm-2 FWHM | |
| beam size at 25m 90 x 3 mm2 (HxV) FWHM | |
| total horiz. ang. acceptance 3.6 mrad |
|
optics |
optical elements: mirror 1* double-crystal mono. mirror 2* |
| distance from source: 25 m 28.5 m 32 m | |
| focusing type: vert. coll. horiz. foc. vert. foc. | |
| *mirrors only used for low energy set-up (5-28 keV) | |
| beam size at sample: 1 x 2 mm2 (HxV) for 5 - 28 keV | |
| 1 x 2 mm2 (HxV) for 28 - 50 keV | |
| spectral range: 5 - 85 keV | |
| energy resolution DE/E: 10-5 - 10-4 | |
| flux at sample: 1010 - 1011 ph s-1 (0.01%bw, 0.1A) |
|
detectors |
see text |



