- Home
- Users & Science
- Find a beamline
- X-ray nanoprobe
- ID01 - Microdiffraction imaging
- Other Scientific Applications and Projects
Diffuse scattering appears in all materials as soon as any non-periodical disorder occurs. By tuning the incident X-ray energy close to atomic absorption edge energies, the atomic scattering amplitudes are changed and consequently the contribution to the scattering contrast in multi-component systems. This method is known as the anomalous scattering technique. Combined WAXS and SAXS measurements at a set of X-ray energies within the anomalous scattering regimes allow the extraction of the partial atomic pair correlations, as well as the detailed analysis of the scattering contrast for extended length scales. Elastic diffuse scattering studies in conventional scattering geometry (transmission and reflection) are therefore fundamental to understand structural properties in materials like:
The energy range 5 keV < E < 35 keV is sufficient for K-edge studies of elements in the range 22 < Z < 55. For Z > 55 one must use LIII edges. Sample thicknesses for experiments will still be in the µm range for transmission experiments. Below 5 keV, transmission experiments will become difficult due to the reduction of sample thickness. However, thin film studies will still be possible.
In conclusion, ID01 is not only of interest for materials research, but also for areas requesting low energy X-rays such as:
It is hoped that many of these areas will benefit from the soft part of the x-ray spectrum.
The medium-high energy part of the X-ray spectrum is extensively exploited in measurements such as: