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TIME-OF-FLIGHT MOMENTUM MICROSCOPE

DETECTOR SYSTEMS HIGH VOLTAGE SUPPLIES FAST ANALOG ELECTRONICSTIME MEASUREMENT SYSTEMS

Momentum Microscopy and Spectroscopy System for Extraction of ARPES Spectra from Small Sample Real Space Areas

Images the Full Emission Hemisphere (2πK2) k-space

Momentum Resolution <0,01 Å-1

Energy Resolution <20 meV (17 meV shown)

k-space out of Selectable Real Space <1 µm

L-He cooled Sample Stage (<30 K - 400 K)

Upgradable for Parallel Spin Imaging

WITH SPIN IMAGING OPTION

IDEAL FOR

TIME RESO LVED ARPE

S

TIME RESO LVED DAR

KFIELD M ICROSCOP

Y

DYNAMIC SPIN IMA

GING