ESRF News June 2021

Residual Gas Analysis Perform RGA at UHV/XHV . Our RGA configurations include systems for UHV

science applications including temperature-programmed desorption and

electron/photon stimulated desorption.

Thin Film Surface Analysis Conduct both static and dynamic SIMS analysis with a choice of primary ions

for full chemical composition and depth profiling. Our SIMS solutions include

complete workstations and bolt-on modules.

Plasma Characterisation Fully characterise a range of plasmas: RF, DC, ECR and pulsed plasmas, including

neutrals and neutral radicals. Extend your analyses to atmospheric pressure

processes using the HPR-60, with time-resolved mass/energy analysis.

Instruments for Advanced Science Mass spectrometers for vacuum, gas, plasma and surface science