[2020|2019 | 2018 | 2017 | 2016  | 2015]


Ahl S.R., Simons H., Detlefs C., Jensen D.J., Poulsen H.F. (2020). Subgrain dynamics during recovery of partly recrystallized aluminum Acta Materialia 185, 142-148. http://dx.doi.org/10.1016/j.actamat.2019.10.042

Gustafson S., Ludwig W., Shade P., Naragani D., Pagan D., Cook P., Yildirim C., Detlefs C., Sangid M.D. (2020). Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations Nature Communications 11, 3189-1-3189-10. http://dx.doi.org/10.1038/s41467-020-16894-2

Hlushko K., Keckes J., Ressel G., Pörnbacher J., Ecker W., Kutsal M., Cook P.K., Detlefs C., Yildirim C. (2020). Dark-field X-ray microscopy reveals mosaicity and strain gradients across sub-surface TiC and TiN particles in steel matrix composites Scripta Materialia 187, 402-406. http://dx.doi.org/10.1016/j.scriptamat.2020.06.053

Ormstrup J., Ostergaard E.V., Detlefs C., Mathiesen R.H., Yildirim C., Kutsal M., Cook P.K., Watier Y., Cosculluela C., Simons H. (2020). Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy Review of Scientific Instruments 91, 065103-1-065103-8. https://doi.org/10.1063/1.5142319

Yildirim C., Vitoux H., Dresselhaus-Marais L.E., Steinmann R., Watier Y., Cook P.K., Kutsal M., Detlefs C. (2020). Radiation furnace for synchrotron dark-field x-ray microscopy experiments Review of Scientific Instruments 91, 065109-1-065109-8. https://doi.org/10.1063/1.5141139


Sierra, J. X., Poulsen, H. F., Jørgensen, P. S., Detlefs, C., Cook, P., Simons, H., … Bowen, J. R. (2019). In-operando observation of microstructural evolution in a solid oxide cell electrolyte operating at high polarization. Journal of Power Sources, 413, 351–359. https://doi.org/10.1016/j.jpowsour.2018.12.057

Kutsal, M., Bernard, P., Berruyer, G., Cook, P. K., Hino, R., Jakobsen, A. C., … Detlefs, C. (2019). The ESRF dark-field x-ray microscope at ID06. IOP Conference Series: Materials Science and Engineering, 580, 012007. https://doi.org/10.1088/1757-899X/580/1/012007

Mavrikakis, N., Detlefs, C., Cook, P. K., Kutsal, M., Campos, A. P. C., Gauvin, M., … Yildirim, C. (2019). A multi-scale study of the interaction of Sn solutes with dislocations during static recovery in α-Fe. Acta Materialia, 174, 92–104. https://doi.org/10.1016/j.actamat.2019.05.021

Murray, K. T., Pedersen, A. F., Mohacsi, I., Detlefs, C., Morgan, A. J., Prasciolu, M., … Bajt, S. (2019). Multilayer Laue lenses at high X-ray energies: performance and applications. Optics Express, 27(5), 7120. https://doi.org/10.1364/OE.27.007120

Falch, K. V., Detlefs, C., Christensen, M. S., Paganin, D., & Mathiesen, R. (2019). Experimental investigation of Gaussian random phase screen model for x-ray diffusers. Optics Express, 27(15), 20311. https://doi.org/10.1364/OE.27.020311

Jakobsen, A. C., Simons, H., Ludwig, W., Yildirim, C., Leemreize, H., Porz, L., … Poulsen, H. F. (2019). Mapping of individual dislocations with dark-field X-ray microscopy. Journal of Applied Crystallography, 52. https://doi.org/10.1107/S1600576718017302

Simons, H., Jakobsen, A. C., Ahl, S. R., Poulsen, H. F., Pantleon, W., Chu, Y.-H., … Valanoor, N. (2019). Nondestructive Mapping of Long-Range Dislocation Strain Fields in an Epitaxial Complex Metal Oxide. Nano Letters, 19(3), 1445–1450. https://doi.org/10.1021/acs.nanolett.8b03839


Simons, H., Haugen, A. B., Jakobsen, A. C., Schmidt, S., Stöhr, F., Majkut, M., … Poulsen, H. F. (2018). Long-range symmetry breaking in embedded ferroelectrics. Nature Materials, 17(9). https://doi.org/10.1038/s41563-018-0116-3

Poulsen, H. F., Cook, P. K., Leemreize, H., Pedersen, A. F., Yildirim, C., Kutsal, M., … Detlefs, C. (2018). Reciprocal space mapping and strain scanning using X-ray diffraction microscopy. Journal of Applied Crystallography, 51(5), 1428–1436. https://doi.org/10.1107/S1600576718011378

Falch, K. V., Detlefs, C., Snigirev, A., & Mathiesen, R. H. (2018). Analytical transmission cross-coefficients for pink beam X-ray microscopy based on compound refractive lenses. Ultramicroscopy, 184, 1–7. https://doi.org/10.1016/j.ultramic.2017.09.010

Falch, K. V., Lyubomirsky, M., Casari, D., Snigirev, A., Snigireva, I., Detlefs, C., … Mathiesen, R. H. (2018). Zernike phase contrast in high-energy x-ray transmission microscopy based on refractive optics. Ultramicroscopy, 184, 267–273. https://doi.org/10.1016/j.ultramic.2017.10.001

Cook, P. K., Simons, H., Jakobsen, A. C., Yildirim, C., Poulsen, H. F., & Detlefs, C. (2018). Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy. Microscopy and Microanalysis, 24(S2), 90–91. https://doi.org/10.1017/S1431927618012837


Simons, H., Ahl, S. R., Poulsen, H. F., & Detlefs, C. (2017). Simulating and optimizing compound refractive lens-based X-ray microscopes. Journal of Synchrotron Radiation, 24(2), 392–401. https://doi.org/10.1107/S160057751602049X

Poulsen, H. F., Jakobsen, A. C., Simons, H., Ahl, S. R., Cook, P. K., & Detlefs, C. (2017). X-ray diffraction microscopy based on refractive optics. Journal of Applied Crystallography, 50(5), 1441–1456. https://doi.org/10.1107/S1600576717011037

Ahl, S. R., Simons, H., Zhang, Y. B., Detlefs, C., Stöhr, F., Jakobsen, A. C., … Poulsen, H. F. (2017). Ultra-low-angle boundary networks within recrystallizing grains. Scripta Materialia, 139. https://doi.org/10.1016/j.scriptamat.2017.06.016

Falch, K. V., Casari, D., Di Michiel, M., Detlefs, C., Snigireva, A., Snigireva, I., … Mathiesen, R. H. (2017). In situ hard X-ray transmission microscopy for material science. Journal of Materials Science, 52(6), 3497–3507. https://doi.org/10.1007/s10853-016-0643-8

Zverev, D., Barannikov, A., Snigireva, I., & Snigirev, A. (2017). X-ray refractive parabolic axicon lens. Optics Express, 25(23), 28469. https://doi.org/10.1364/OE.25.028469

Tran Thi, T. N., Morse, J., Caliste, D., Fernandez, B., Eon, D., Härtwig, J., … Baruchel, J. (2017). Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications. Journal of Applied Crystallography, 50(2), 561–569. https://doi.org/10.1107/S1600576717003831


Falch, K. V., Detlefs, C., Di Michiel, M., Snigireva, I., Snigirev, A., & Mathiesen, R. H. (2016). Correcting lateral chromatic aberrations in non-monochromatic X-ray microscopy. Applied Physics Letters, 109(5), 054103. https://doi.org/10.1063/1.4960193

Simons, H., Jakobsen, A. C., Ahl, S. R., Detlefs, C., & Poulsen, H. F. (2016). Multiscale 3D characterization with dark-field x-ray microscopy. MRS Bulletin, 41(6), 454–459. https://doi.org/10.1557/mrs.2016.114


Simons, H., King, A., Ludwig, W., Detlefs, C., Pantleon, W., Schmidt, S., … Poulsen, H. F. (2015). Dark-field X-ray microscopy for multiscale structural characterization. Nature Communications, 6(1), 6098. https://doi.org/10.1038/ncomms7098

Roth, T., Detlefs, C., Snigireva, I., & Snigirev, A. (2015). X-ray diffraction microscopy based on refractive optics. Optics Communications, 340, 33–38. https://doi.org/10.1016/j.optcom.2014.11.094