ID03
Synopsis
The beamline is dedicated to the in-situ studies of the structure and morphology of surfaces. It hosts two diffractometers, one for UHV studies and one that can host different user-specific apparatuses. Real-time experiments are possible, giving the possibility of studying growth processes or reaction at surfaces (as heterogenous catalysis).Disciplines
- Physics
- Chemistry
- Environmental Sciences
- Life Sciences
Applications
- Surface science
- Nanoscience
- Catalysis
- Liquid-solid interfaces
- Solid-Solid interfaces
- Growth
- Surface phase transitions
Techniques
- Anomalous diffraction
- DAFS - diffraction anomalous fine structure
- GID - grazing incidence diffraction
- GISAXS - grazing incidence small-angle scattering
- MOKE - magnetic optical Kerr effect
- Resonant diffraction
- SXRD - surface X-ray diffraction
- XRR - X-ray reflectivity
Energy range
- 5.0 - 30.0 keV
Beam size
- Minimum (H x V) : 3.0 x 2.0 µm²
- Maximum (H x V) : 600.0 x 600.0 µm²
Sample environments
- UHV end station:
- -Pressure range 10^-10 mbar - 1 bar
- -T range 15K - 2000K
- -Quartz balance
- -Auger electron spectroscopy (AES)
- -e-beam evaporators
- -Knudsen cells
- Flow reactor
- -pressure range: min pressure 10^-9 mbar
- -pressure range in flow conditions: 10 mbar - 2 bars (up to 5 is possible)
- -mass flow controller for oxygen, carbon mono-oxide, argon, methane, and other gases on request
- -T range 300K - 1200K
- -ion sputtering
- -e-beam evaporator
- -Mass spectrometer
- Batch reactor
- -pressure range 1*10^-9 mbar - 3 bars
- -T range 300K - 1200K
- -ion sputtering
- -mass spectrometer
- Batch reactor for harsh conditions (suitable for use with HCl, H2S gases and similar)
- -pressure range 1*10^-9 mbar - 3 bars
- -T range 300K - 1200K
- -ion sputtering
- -mass spectrometer
Detectors
- Maxipix 2D pixel detector standard on both diffractometers
- Scintillator counter with energy analyzer
- Avalanche photodiode
- FReLon CCD camera
- MAR CCD camera
- Sensicam
[1] S. Ferrer and F. Comin, "Surface diffraction beamline at the ESRF", Review of Scientific Instruments 66 (1995) 1674-1676. [2] P. Bernard, K. Peters, J. Alvarez, et al., "Ultrahigh vacuum high pressure chamber for surface x-ray diffraction experiments", Review of Scientific Instruments 70 (1999) 1478-1480. [3] O. Balmes, R. van Rijn, D. Wermeille, A. Resta, L. Petit, H. Isern, T. Dufrane, R. Felici, "The ID03 surface diffraction beamline for in-situ and real-time X-ray investigations of catalytic reactions at surfaces", Catalysis Today 145 (2009) 220-226. [4] R. van Rijn, M.D. Ackermann, O. Balmes, T. Dufrane, A. Geluk, H. Gonzalez, H. IseÌrn, E. de Kuyper, L. Petit, V.A. Sole, D. Wermeille, R. Felici, and J.W.M. Frenken, "Ultrahigh vacuum/high-pressure flow reactor for surface x-ray diffraction and grazing incidence small angle x-ray scattering studies close to conditions for industrial catalysis", Review of Scientific Instruments 81 (2010) 014101-1-014101-8.