ID03 is the dedicated Surface X-Ray Diffraction (SXRD) beamline at the ESRF. SXRD is a well established technique to study surfaces and interfaces.

Scientific Applications

  • Surface crystallography from UHV to atmospheric pressure
  • In-situ characterization of dynamical phenomena: homoepitaxy, heteroepitaxy, surface morphology, phase transitions, ...
  • Structural and magnetic characterization of metallic thin films using diffraction and MOKE
  • Characterization of reaction at surfaces: catalysis
  • Electrochemistry


The following techniques are available at the beamline:

  • Surface X-Ray Diffraction
  • Grazing Incidence Small Angle X-Ray Scattering
  • Anomalous X-Ray Diffraction
  • Coherent Diffraction Imaging