Early-stage growth of GeTe on Si(111)-Sb
Croes B., Cheynis F., Fagot-Revurat Y., Müller P., Curiotto S., Leroy F.,
Physical Review Materials 7, 014409-1-014409-8The advent of germanium telluride as a promising ferroelectric Rashba semiconductor for spintronic applications requires the growth of nanometer-thick films of high crystalline quality. In this study, we have elucidated the initial growth stages of GeTe on Si(111)-Sb by scanning tunneling microscopy and low energy electron diffraction. We demonstrate the presence of an initial 0.35-nm-thick GeTe buffer layer followed by the 2D growth of GeTe via Frank-Read sources of atomic steps. As shown by core level spectroscopy, Sb is acting as a surfactant during growth up to a 5-nm-thick film. X-ray diffraction, transmission electron microscopy, and low energy electron microscopy evidence that numerous mirror domains and in-plane misorientations appear early in the growth process and are gradually buried at the film/substrate interface. The use of a miscut Si substrate close to Si(111) allows suppressing these defects from the early beginning of growth. (2023)
Toward a method of understanding the complexation of rare earth element by functionalized organosilanes in aqueous media
Walker O., Rébiscoul D., Odorico M., Tardif S., Pellet-Rostaing S., Arrachart G.,
Colloids and Surfaces A 662, 131049-1-131049-9 (2023)
Superstructures, commensurations, and rotation of single-layer TaS2 on Au(111) induced by Cs intercalation/deintercalation
Weng X., David P., Guisset V., Martinelli L., Geaymond O., Coraux J., Renaud G.,
ACS Nano 17, 5459-5471 (2023)
In-situ characterization of thermomechanical behavior of copper nano-interconnect for 3D integration
Ayoub B., Moreau S., Lhostis S., Frémont H., Mermoz S., Souchier E., Deloffre E., Escoubas S., Cornelius T.W., Thomas O.,
Microelectronic Engineering 261, 111809-1-111809-6 (2022)
Using 2D integral breadth to study plastic relaxation in a quasi-lattice-matched HgCdTe/CdZnTe heterostructure
Biquard X., Tuaz A., Ballet P.,
Journal of Applied Crystallography 55, 1297-1304 (2022)
Croissance et ferroélectricité du GeTe sur Si (111)
Croes B.
From: Université Aix-Marseille, France (PhD Thesis),
2022
Polar surface of ferroelectric nanodomains in GeTe thin films
Croes B., Cheynis F., Müller P., Curiotto S., Leroy F.,
Physical Review Materials 6, 064407-1-064407-9 (2022)
Etude des phases solides métastable et stable de corium issus de trempe par approche multiechelle, étude d'un chemin réactionnel
Jizzini M.
From: Université de Limoges, France (PhD Thesis),
2022
Synthetic and dynamic control in strongly correlated transition metal oxides
Marks S.D.
From: University of Wisconsin, USA (PhD Thesis),
2022
LaueNN: Neural-network-based hkl recognition of Laue spots and its application to polycrystalline materials
Purushottam Raj Purohit R.R.P., Tardif S., Castelnau O., Eymery J., Guinebretière R., Robach O., Ors T., Micha J.S.,
Journal of Applied Crystallography 55, 737-750 (2022)
Experimentally probing ionic solutions in single-digit nanoconfinement
Rébiscoul D., Baum M., Wang K., Tardif S., Larrey V., Siboulet B., Dufrêche J.F., Rieutord F.,
Journal of Colloid and Interface Science 614, 396-404 (2022)
Uraninite alteration by H2O2 solutions and formation of secondary phases: An in situ microRaman spectroscopy and synchrotron X-ray diffraction study
Schlegel M.L., Jégou C.,
Journal of Nuclear Materials 572, 154056-1-154056-13 (2022)
Phase transitions in flexible solution-processed ferroelectric P(VDF-TrFE) copolymer thin films
Toinet S., Benwadih M., Tardif S., Eymery J., Revenant C.,
Journal of Polymer Research 29, 456-1-456-10 (2022)
Grain structure engineering of NiTi shape memory alloys by intensive plastic deformation
Wang Z., Chen J., Kocich R., Tardif S., Dolbnya I.P., Kunčická L., Micha J.S., Liogas K., Magdysyuk O.V., Szurman I., Korsunsky A.M.,
ACS Applied Materials & Interfaces 14, 31396-31410 (2022)
VHCF damage in duplex stainless steel revealed by microbeam energy-dispersive X-ray Laue diffraction
Abboud A., AlHassan A., Dönges B., Micha J.S., Hartmann R., Strüder L., Christ H.J., Pietsch U.,
International Journal of Fatigue 151, 106358-1-106358-10 (2021)
Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire
AlHassan A., Abboud A., Cornelius T.W., Ren Z., Thomas O., Richter G., Micha J.S., Send S., Hartmann R., Strüder L., Pietsch U.,
Journal of Applied Crystallography 54, 80-86 (2021)
Epitaxie de GaN sur substrat de graphène
Barbier C.
From: Sorbonne Université, France (PhD Thesis),
2021
Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10-5 resolution
Biquard X., Ballet P., Tuaz A., Jouneau P.H., Rieutord F.,
Journal of Synchrotron Radiation 28, 181-187 (2021)
Corrosion products formed on MgZr alloy embedded in geopolymer used as conditioning matrix for nuclear waste-A proposition of interconnected processes
Boubon R., Nelayah J., Tardif S., Deschanels X., Rébiscoul D.,
Materials 14, 2017-1-2017-16 (2021)
Twin boundary migration in an individual platinum nanocrystal during catalytic CO oxidation
Carnis J., Kshirsagar A.R., Wu L., Dupraz M., Labat S., Texier M., Favre L., Gao L., Oropeza F.E., Gazit N., Almog E., Campos A., Micha J.S., Hensen E.J.M., Leake S.J., Schülli T.U., Rabkin E., Thomas O., Poloni R., Hofmann J.P., Richard M.I.,
Nature Communications 12, 5385-1-5385-10 (2021)
Growth-mode and interface structure of epitaxial ultrathin MgO/Ag(001) films
De Santis M., Langlais V., Schneider K., Torrelles X.,
Journal of Physics Condensed Matter 33, 265002-1-265002-7 (2021)
Grain boundary formation through particle detachment during coarsening of nanoporous metals
Elder K.L.M., Andrews W.B., Ziehmer M., Mameka N., Kirchlechner C., Davydok A., Micha J.S., Chadwick A.F., Lilleodden E.T., Thornton K., Voorhees P.W.,
Proceedings of the National Academy of Sciences of the USA 118, e2104132118-1-e2104132118-10 (2021)
Simultaneous multi-Bragg peak coherent X-ray diffraction imaging
Lauraux F., Labat S., Yehya S., Richard M.I., Leake S.J., Zhou T., Micha J.S., Robach O., Kovalenko O., Rabkin E., Schülli T.U., Thomas O., Cornelius T.W.,
Crystals 11, 312-1-132-10 (2021)
In‐situ force measurement during nano‐indentation combined with Laue microdiffraction
Lauraux F., Yehya S., Labat S., Micha J.S., Robach O., Kovalenko O., Rabkin E., Thomas O., Cornelius T.W.,
Nano Select 2, 99-106 (2021)
Huge local elastic strains in bulk nanostructured pure zirconia materials
Ors T., Gouraud F., Michel V., Huger M., Gey N., Micha J.S., Castelnau O., Guinebretière R.,
Materials Science and Engineering A 806, 140817-1-140817-10 (2021)
Textures magnétiques chirales en couches minces épitaxiales avec symétrie C2v
Peña Garcia J.A.
From: Université Grenoble Alpes, France (PhD Thesis),
2021
In situ X-ray diffraction study of GaN nucleation on transferred graphene
Barbier C., Zhou T., Renaud G., Geaymond O., Le Fèvre P., Glas F., Madouri A., Cavanna A., Travers L., Morassi M., Gogneau N., Tchernycheva M., Harmand J.C., Largeau L.,
Crystal Growth & Design 20, 4013-4019 (2020)
Al-rich Fe0.85Al0.15(1 0 0), (1 1 0) and (1 1 1) surface structures
Dai Z., Alyabyeva N., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Lazzari R.,
Applied Surface Science 509, 145312-1-145312-7 (2020)
Oxide at the Al-rich Fe0.85Al0.15(110) surface
Dai Z., Alyabyeva N., Van den Bossche M., Borghetti P., Chenot S., David P., Koltsov A., Renaud G., Jupille J., Cabailh G., Noguera C., Goniakowski J., Lazzari R.,
Physical Review Materials 4, 074409-1-074409-11 (2020)
Elaboration and characterization of a 200 mm stretchable and flexible ultra-thin semi-conductor film
Michaud L.G., Castán C., Zussy M., Montméat P., Mareau V.H., Gonon L., Fournel F., Rieutord F., Tardif S.,
Nanotechnology 31, 145302-1-145302-7 (2020)
First stages of plasticity in three-point bent Au nanowires detected by in situ Laue microdiffraction
Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O.,
Applied Physics Letters 116, 243101-1-243101-5 (2020)
Synthesis of epitaxial monolayer Janus SPtSe
Sant R., Gay M., Marty A., Lisi S., Harrabi R., Vergnaud C., Dau M.T., Weng X., Coraux J., Gauthier N., Renault O., Renaud G., Jamet M.,
Npj 2D Materials and Applications 4, 41-1-41-8 (2020)
Decoupling molybdenum disulfide from its substrate by cesium intercalation
Sant R., Lisi S., Nguyen V.D., Mazaleyrat E., Gómez Herrero A.C., Geaymond O., Guisset V., David P., Marty A., Jamet M., Chapelier C., Magaud L., Dappe Y.J., Bianchi M., Hofmann P., Renaud G., Coraux J.,
Journal of Physical Chemistry C 124, 12397-12408 (2020)
Elaboration of nanomagnet arrays: Organization and magnetic properties of mass-selected FePt nanoparticles deposited on epitaxially grown graphene on Ir(111)
Capiod P., Bardotti L., Tamion A., Boisron O., Albin C., Dupuis V., Renaud G., Ohresser P., Tournus F.,
Physical Review Letters 122, 106802-1-106802 -7 (2019)
Epitaxial growth and structure of cobalt ferrite thin films with large inversion parameter on Ag(001)
De Santis M., Bailly A., Coates I., Grenier S., Heckmann O., Hricovini K., Joly Y., Langlais V., Ramos A.Y., Richter C., Torrelles X., Garaudée S., Geaymond O., Ulrich O.,
Acta Crystallographica B 75, 8-17 (2019)
Room temperature commensurate charge density wave in epitaxial strained TiTe2 multilayer films
Fragkos S., Sant R., Alvarez C., Bosak A., Tsipas P., Tsoutsou D., Okuno H., Renaud G., Dimoulas A.,
Advanced Materials Interfaces 6, 1801850-1-1801850-9 (2019)
Topological band crossings in epitaxial strained SnTe
Fragkos S., Sant R., Alvarez C., Golias E., Marquez-Velasco J., Tsipas P., Tsoutsou D., Aminalragia-Giamini S., Xenogiannopoulou E., Okuno H., Renaud G., Rader O., Dimoulas A.,
Physical Review Materials 3, 104201-1-104201-8 (2019)
Long term evolution of microstructure and stress around tin whiskers investigated using scanning Laue microdiffraction
Hektor J., Micha J.S., Hall S.A., Iyengar S., Ristinmaa M.,
Acta Materialia 168, 210-221 (2019)
Attractive interaction between fully charged lipid bilayers in a strongly confined geometry
Mukhina T., Hemmerle A., Rondelli V., Gerelli Y., Fragneto G., Daillant J., Charitat T.,
Journal of Physical Chemistry Letters 10, 7195-7199 (2019)
Advanced coherent X-ray diffraction and electron microscopy of individual InP nanocrystals on Si nanotips for III-V-on-Si electronics and optoelectronics
Niu G., Leake S.J., Skibitzki O., Niermann T., Carnis J., Kiessling F., Hatami F., Hussein E.H., Schubert M.A., Zaumseil P., Capellini G., Masselink W.T., Ren W., Ye Z.G., Lehmann M., Schülli T., Schroeder T., Richards M.I.,
Physical Review Applied 11, 064046-1-064046-9 (2019)
Validity of crystal plasticity models near grain boundaries: Contribution of elastic strain measurements at micron scale
Plancher E., Tajdary P., Auger T., Castelnau O., Favier V., Loisnard D., Marijon J.B., Maurice C., Michel V., Robach O., Stodolna J.,
JOM 71, 3543-3551 (2019)
Impact of silica surface nanoconfinement on the microstructure of alkoxysilane layers grafted by supercritical carbon dioxide
Rébiscoul D., Israel S.S., Tardif S., Larrey V., Ayral A., Rieutord F.,
Journal of Physical Chemistry C 123, 12305-12312 (2019)
Carbon monoxide oxidation promoted by a highly active strained PdO layer at the surface of Au30Pd70(110)
Saint-Lager M.C., Languille M.A., Cadete Santos Aires F.J., Bailly A., Garaudée S., Ehret E., Robach O.,
ACS Catalysis 9, 4448-4461 (2019)
Regular arrays of Pt clusters on alumina: A new superstructure on Al2O3/Ni3Al(111)
Sitja G., Bailly A., De Santis M., Heresanu V., Henry C.R.,
Journal of Physical Chemistry C 123, 24487-24494 (2019)
Physical properties of interfacial layers developed on weathered silicates: A case study based on labradorite feldspar
Wild B., Daval D., Micha J.S., Bourg I.C., White C.E., Fernández-Martínez A.,
Journal of Physical Chemistry C 123, 24520-24532 (2019)
Gas-induced selective re-orientation of Au–Cu nanoparticles on TiO2 (110)
Wilson A., Bailly A., Bernard R., Borensztein Y., Coati A., Croset B., Cruguel H., Naitabdi A., Silly M., Saint-Lager M.C., Vlad A., Witkowski N., Garreau Y., Prévot G.,
Nanoscale 11, 752-761 (2019)
Local strain redistribution in a coarse-grained nickel-based superalloy subjected to shot-peening, fatigue or thermal exposure investigated using synchrotron X-ray Laue microdiffraction
Altinkurt G., Fèvre M., Geandier G., Dehmas M., Robach O., Micha J.S.,
Journal of Materials Science 53, 8567-8589 (2018)
High stresses stored in fault zones: Example of the Nojima fault (Japan)
Boullier A.M., Robach O., Ildefonse B., Barou F., Mainprice D., Ohtani T., Fujimoto K.,
Solid Earth 9, 505-529 (2018)
Beyond van der Waals Interaction: The case of MoSe2 epitaxially grown on few-layer graphene
Dau M.T., Gay M., Di Felice D., Vergnaud C., Marty A., Beigné C., Renaud G., Renault O., Mallet P., Le Quang T., Veuillen J.Y., Huder L., Renard V.T., Chapelier C., Zamborlini G., Jugovac M., Feyer V., Dappe Y.J., Pochet P., Jamet M.,
ACS Nano 12, 2319-2331 (2018)
Flexible capacitive piezoelectric sensor with vertically aligned ultralong GaN wires
El Kacimi A., Pauliac-Vaujour E., Eymery J.,
ACS Applied Materials & Interfaces 10, 4794-4800 (2018)
Tin whiskers: Experiments and modelling
Hektor J.
From: Lund University, Sweden (PhD thesis),
2018
Evidence of 3D strain gradients associated with tin whisker growth
Hektor J., Marijon J.B., Ristinmaa M., Hall S.A., Hallberg H., Iyengar S., Micha J.S., Robach O., Grennerat F., Castelnau O.,
Scripta Materialia 144, 1-4 (2018)
EBSD-assisted Laue microdiffraction for microstrain analysis
Ors T., Micha J.S., Gey N., Michel V., Castelnau O., Guinebretière R.,
Journal of Applied Crystallography 51, 55-67 (2018)
Programmed line width roughness metrology by multitechniques approach
Reche J., Besacier M., Gergaud P., Blancquaert Y., Freychet G., Labbaye T.,
Journal of Micro/Nanolithography, MEMS and MOEMS 17, 41005-1-41005-10 (2018)
Programmed LWR metrology by multi-techniques approach
Reche J., Besacier M., Gergaud P., Blancquaert Y., Freychet G., Labbaye T.,
Proceedings of SPIE 10585, 105850F-1-105850F-14 (2018)
Plasticity in inhomogeneously strained Au nanowires studied by Laue microdiffraction
Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O.,
MRS Advances 3, 2331-2339 (2018)
Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction
Ren Z., Cornelius T.W., Leclere C., Davydok A., Micha J.S., Robach O., Richter G., Thomas O.,
Journal of Applied Physics 124, 185104-1-185104-11 (2018)
Water transport along Si/Si direct wafer bonding interfaces
Rieutord F., Tardif S., Nikitskiy I., Fournel F., Tedjini M., Larrey V., Bridoux C., Morales C., Landru D., Kononchuk O.,
ECS Transactions 86, 39-47 (2018)
Oxygen-induced changes of the Au30Pd70(110) surface structure and composition under increasing O2 pressure
Saint-Lager M.C., Languille M.A., Cadete Santos Aires F.J., Bailly A., Garaudée S., Ehret E., Robach O.,
Journal of Physical Chemistry C 122, 22588-22596 (2018)
In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire
Shin J., Cornelius T.W., Labat S., Lauraux F., Richard M.I., Richter G., Blanchard N.P., Gianola D.S., Thomas O.,
Journal of Applied Crystallography 51, 781-788 (2018)
Direct observation at room temperature of the orthorhombic Weyl semimetal phase in thin epitaxial MoTe2
Tsipas P., Fragkos S., Tsoutsou D., Alvarez C., Sant R., Renaud G., Okuno H., Dimoulas A.,
Advanced Functional Materials 28, 1802084-1-1802084-12 (2018)
Massless Dirac fermions in ZrTe2 semimetal grown on InAs(111) by van der Waals epitaxy
Tsipas P., Tsoutsou D., Fragkos S., Sant R., Alvarez C., Okuno H., Renaud G., Alcotte R., Baron T., Dimoulas A.,
ACS Nano 12, 1696-1703 (2018)
Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector
Abboud A, Kirchlechner C., Keckes J., Nurdan T.C., Send S., Micha J.S., Ulrich O., Hartmann R., Strüder L., Pietsch U.,
Journal of Applied Crystallography 50, 901-908 (2017)
Full elastic strain tensor determination at the phase scale in a powder metallurgy nickel-based superalloy using X-ray Laue microdiffraction
Altinkurt G., Fèvre M., Robach O., Micha J.S., Geandier G., Dehmas M.,
Journal of Applied Crystallography 50, 1754-1765 (2017)
Molecular beam epitaxy of thin HfTe2 semimetal films
Aminalragia-Giamini S., Marquez-Velasco J., Tsipas P., Tsoutsou D., Renaud G., Dimoulas A.,
2D Materials 4, 015001-1-015001-24 (2017)
Influence of palladium on the ordering, the final size and composition of Pd-Au nanoparticle arrays
Bailly A., Sitja G., Saint-Lager M.C., Le Moal S., Leroy F., De Santis M., Henry C.R., Robach O.,
Journal of Physical Chemistry C 121, 25864-25874 (2017)
X-ray reflectivity analysis of SiO2 nanochannels filled with water and ions: A new method for the determination of the spatial distribution of ions inside confined media
Baum M., Rébiscoul D., Tardif S., Tas N., Mercury L., Rieutord F.,
Procedia Earth and Planetary Science 17, 682-685 (2017)
Etude des collages directs hydrophiles mettant en jeu des couches diélectriques
Bêche E.
From: Université Grenoble Alpes, France (PhD Thesis),
2017
Dynamics of altered surface layer formation on dissolving silicates
Daval D., Bernard S., Remusat L., Wild B., Guyot F., Micha J.S., Rieutord F., Magnin V., Fernández-Martínez A.,
Geochimica et Cosmochimica Acta 209, 51-69 (2017)
Thin-wall GaN/InAlN multiple quantum well tubes
Durand C., Carlin J.F., Bougerol C., Gayral B., Salomon D., Barnes J.P., Eymery J., Butté R., Grandjean N.,
Nano Letters 17, 3347-3355 (2017)
Raman-strain relations in highly strained Ge: Uniaxial ⟨100⟩, ⟨110⟩ and biaxial (001) stress
Gassenq A., Tardif S., Guilloy K., Duchemin I., Pauc N., Hartmann J.M., Rouchon D., Widiez J., Niquet Y.M., Milord L., Zabel T., Sigg H., Faist J., Chelnokov A., Rieutord F., Reboud V., Calvo V.,
Journal of Applied Physics 121, 055702-1-055702-8 (2017)
High-quality and homogeneous 200-mm GeOI wafers processed for high strain induction in Ge
Gassenq A., Tardif S., Guilloy K., Pauc N., Bertrand M., Rouchon D., Hartmann J.M., Widiez J., Rothman J., Niquet Y.M., Duchemin I., Faist J., Zabel T., Sigg H., Rieutord F., Chelnokov A., Reboud V., Calvo V.,
Proceedings SPIE 10108, 101081B-1-101081B-9 (2017)
Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray diffraction: Application to chromia-forming metallic alloys
Guerain M., Grosseau-Poussard J.L., Geandier G., Panicaud B., Tamura N., Kunz M., Dejoie C., Micha J.S., Thiaudière D., Goudeau P.,
Journal of Applied Physics 122, 195105-1-195105-9 (2017)
Mechanical behaviour near grain boundaries of He-implanted UO2 ceramic polycrystals
Ibrahim M., Castelier E., Palancher H., Bornert M., Caré S., Micha J.S.,
Journal of Nuclear Materials 483, 13-20 (2017)
In situ µLaue: Instrumental setup for the deformation of micron sized samples
Kirchlechner C., Keckes J., Micha J.S., Dehm G.,
In: "Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications. 2nd Edition" Staron P. (Eds.) Schreyer A. (Eds.) Clemens H. (Eds.) Mayer S. (Eds.) (Wiley, 2017) pp. 425-438
Growth and properties of CoO/Fe perpendicular exchange coupled ultra-thin films
Lamirand A.D., Grenier S., Ramos A.Y., De Santis M., Bailly A., Mossang E., Tonnerre J.M., Testemale D., Tolentino H.C.N., Jaouen N., Soares M.M., Jamet M., Proux O.,
Journal of Magnetism and Magnetic Materials 443, 195-201 (2017)
Analyse multi-échelles des déformations/contraintes sur des assemblages électroniques complexes : application à la technologie flip-chip
Lebaudy A.L., Pesci R.,
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Dislocation transmission through copper grain boundaries at the micron scale
Malyar N.V.
From: Ruhr-Universität Bochum, Germany (PhD Thesis),
2017
Dislocation-twin boundary interaction in small scale Cu bi-crystals loaded in different crystallographic directions
Malyar N.V., Micha J.S., Dehm G., Kirchlechner C.,
Acta Materialia 129, 91-97 (2017)
Size effect in bi-crystalline micropillars with a penetrable high angle grain boundary
Malyar N.V., Micha J.S., Dehm G., Kirchlechner C.,
Acta Materialia 129, 312-320 (2017)
Caractérisation 3D de la microstructure et des déformations élastiques des polycristaux par microdiffractiodiffraction Laue
Marijon J.B.
From: Paris Tech, Ecole Nationale Supérieure d'Arts et Métiers, France (PhD Thesis),
2017
Modélisation physique des procédés de fabrication des jonctions FDSOI pour le nœud 10 nm et en-deçà (Physical modelling of junction fabrication processes on FDSOI substrate for the 10 nm node and below)
Payet A.
From: Université Grenoble Alpes, France (PhD Thesis),
2017
Direct measurement of local constitutive relations, at the micrometre scale, in bulk metallic alloys
Plancher E., Favier V., Maurice C., Bosso E., Rupin N., Stodolna J., Loisnard D., Marijon J.B., Petit J., Micha J.S., Robach O., Castelnau O.,
Journal of Applied Crystallography 50, 940-948 (2017)
Germanium based photonic components toward a full silicon/germanium photonic platform
Reboud V., Gassenq A., Hartmann J.M., Widiez J., Virot L., Aubin J., Guilloy K., Tardif S., Fédéli J.M., Pauc N., Chelnokov A., Calvo V.,
Progress in Crystal Growth and Characterization of Materials 63, 1-24 (2017)
Analyse avancée des contraintes et des gradients d'orientation par microdiffraction Laue des rayons X
Robach O., Micha J.S., Ulrich O., Devincre B., Hoc T., Daveau G., Consonni V., Petit J.,
In: "Rayons X et Matière 5, RX2013" Guinebretière R. (Eds.) Goudeau P. (Eds.) (ISTE Ltd, 2017) pp. 83-148
Operando raman spectroscopy and synchrotron X-ray diffraction of lithiation/delithiation in silicon nanoparticle anodes
Tardif S., Pavlenko E., Quazuguel L., Boniface M., Maréchal M., Micha J.S., Gonon L., Mareau V., Gébel G., Bayle-Guillemaud P., Rieutord F., Lyonnard S.,
ACS Nano 11, 11306-11316 (2017)
Micro-diffraction Investigation of localized strain in mesa-etched HgCdTe photodiodes
Tuaz A., Ballet P., Biquard X., Rieutord F.,
Journal of Electronic Materials 46, 5442-5447 (2017)
Top-down method to introduce ultra-high elastic strain
Zabel T., Geiger R., Marin E., Müller E., Diaz A., Bonzon C., Süess M.J., Spolenak R., Faist J., Sigg H.,
Journal of Materials Research 32, 726-736 (2017)
Accuracy of stress measurement by Laue microdiffraction (Laue-DIC method): The influence of image noise, calibration errors and spot number
Zhang F.G., Bornert M., Petit J., Castelnau O.,
Journal of Synchrotron Radiation 24, 802-817 (2017)
Effect of thermal and mechanical loadings on the residual stress field in a nickel based superalloy using X-ray Laue microdiffraction
Altinkurt G., Fèvre M., Geandier G., Robach O., Guernaoui S., Dehmas M.,
Materials Research Proceedings 2, 527-532 (2016)
Unraveling the strain state of GaN down to single nanowires
Auzelle T., Biquard X., Bellet-Amalric E., Fang Z., Roussel H., Cros A., Daudin B.,
Journal of Applied Physics 120, 225701-1-225701-7 (2016)
Influence des gaz de fission sur l'état mécanique des combustibles oxydes irradiés
Cagna C.
From: Ecole nationale supérieure d'arts et métiers, France (PhD Thesis),
2016
Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction
Davydok A., Jaya B.N., Robach O., Ulrich O., Micha J.S., Kirchlechner C.,
Materials and Design 108, 68-75 (2016)
Integrated experimental and computational approach for residual stress investigation near through-silicon vias
Deluca M., Hammer R., Keckes J., Kraft J., Schrank F., Todt J., Robach O., Micha J.S., Defregger S.,
Journal of Applied Physics 120, 195104-1-195104-9 (2016)
Wetting layer of copper on the tantalum (001) surface
Dupraz M., Poloni R., Ratter K., Rodney D., De Santis M., Gilles B., Beutier G., Verdier M.,
Physical Review B 94, 235427-1-235427-9 (2016)
In-situ X-ray μLaue diffraction study of copper through-silicon vias
Ferreira Sanchez D., Reboh S., Weleguela M.L.D., Micha J.S., Robach O., Mourier T., Gergaud P., Bleuet P.,
Microelectronics Reliability 56, 78-84 (2016)
Accurate strain measurements in highly strained Ge microbridges
Gassenq A., Tardif S., Guilloy K., Dias G.O., Pauc N., Duchemin I., Rouchon D., Hartmann J.M., Widiez J., Escalante J.M., Niquet Y.M., Geiger R., Zabel T., Sigg H., Faist J., Chelnokov A., Rieutord F., Reboud V., Calvo V.,
Applied Physics Letters 108, 241902-1-241902-4 (2016)
Micrometer-scale ordering of silicon-containing block copolymer thin films via high-temperature thermal treatments
Giammaria T.J., Lupi F.F., Seguini G., Perego M., Vita F., Francescangeli O., Wenning B., Ober C.K., Sparnacci K., Antonioli D., Gianotti V., Laus M.,
ACS Applied Materials & Interfaces 8, 9897-9908 (2016)
Structure and dopant engineering in PEDOT thin films: Practical tools for a dramatic conductivity enhancement
Gueye M.N., Carella A., Massonnet N., Yvenou E., Brenet S., Faure-Vincent J., Pouget S., Rieutord F., Okuno H., Benayad A., Demadrille R., Simonato J.P.,
Chemistry of Materials 28, 3462-3468 (2016)
Germanium déformé pour l'émission de lumière
Guilloy K.
From: Université Grenoble Alpes, France (PhD Thesis),
2016
