Residual Gas Analysis Perform RGA at UHV/XHV . Our RGA configurations include systems for UHV
science applications including temperature-programmed desorption and
electron/photon stimulated desorption.
Thin Film Surface Analysis Conduct both static and dynamic SIMS analysis with a choice of primary ions
for full chemical composition and depth profiling. Our SIMS solutions include
complete workstations and bolt-on modules.
Plasma Characterisation Fully characterise a range of plasmas: RF, DC, ECR and pulsed plasmas, including
neutrals and neutral radicals. Extend your analyses to atmospheric pressure
processes using the HPR-60, with time-resolved mass/energy analysis.
Instruments for Advanced Science Mass spectrometers for vacuum, gas, plasma and surface science
www.HidenAnalytical.comW E firstname.lastname@example.org