Dates 10 February 2016
Venue ESRF Auditorium
Scientific Organisers

UOC Organisers:
Marco Salluzzo, Alexander Fernandez-Martinez

ESRF Organisers:
Julio da Silva, Tobias Schulli
Keynote Speakers

Ana Diaz, PSI-Villigen, Switzerland
Oleg Shpyrko, University of California San Diego, USA
Administrative Assistant  Isabelle Combe
Contact nanoscience@esrf.fr

 

PROGRAMME AVAILABLE HERE!

Aim & Scope

Nowadays, nanoscience and nanotechnology are at the forefront of science and technology across several disciplines, including physics, material-science, chemistry, biology, and engineering. The phase II upgrade of ESRF will dramatically enhance the impact of research in this field, allowing unprecedented resolution through the availability of largely coherent and intense X-ray radiation. Coherent X-ray diffraction imaging (CXDI) and X-ray ptychography already demonstrated their potential in several domains, from biosciences to materials sciences. Moreover, new methods and techniques, using the full potential of coherent intense x-ray beams, are under development and will be soon available to synchrotron facilities. The possibility of exploiting the coherence of X-ray beams opens new routes to probe the nano-world with more sensitivity and more precision. Chemical and structural selective information can be processed together with sample morphology on several scales, complementary to traditional scanning probe  (STM/AFM) and electron microscopies (STEM-EELS).

Moreover, X-ray techniques allows probing the properties of materials at several scales. Thanks to the huge improvements in spatial resolution of the last few years, sample characteristics from tens of micrometers to the nanometer range can be accessed in a single experiment, which is usually extremely challenging with other techniques. . Here is a partial list of the topics that could be covered by coherent X-ray-techniques: Cell imaging, strain imaging in  nanowires and functional materials, study of low-dimensional materials, of porosity in catalysts samples, hydration of cement paste, defects in microelectronics chips, light material for the airspace industry and many other applications can now take advantage of coherent X-ray diffraction techniques.

This session would be dedicated to the application of X-ray diffraction and Coherence in Nanoscience. We will take the opportunity to bring together expert and non-expert users working on nanosciences by the powerful combination of X-ray diffraction and coherence.